Keysight Technologies Australia Pty Ltd

Site

Test and Calibration Centre, Melbourne

Accreditation No.

99

Site No.

92

Date of Accreditation

19 Aug 1953

Address

745 Springvale Road
Mulgrave, VIC 3170
Australia

keysight.com/

Contact

Mr Leigh Mackinnon P: +61 1800225574

Availability

Services available to external clients

Scope of Accreditation

ISO/IEC 17025 (2017)

Calibration

  • The uncertainty of measurement is reported as an expanded uncertainty having a level of confidence of 95% unless stated otherwise
Service Product Determinant Technique Procedure Limitations
DC and low frequency electrical metrology - Electrical instrument calibrators Instrument calibrators AC current; AC voltage; DC current; DC voltage; Resistance Comparison with a reference standard

Capability

with Calibration and Measurement Capability of -

D.C voltage

5 μV/V + 0.2 μV up to 1 V
3 μV/V from 1 V to 1000 V
7 μV/V from 1000 V to 1020 V

A.C. voltage

From 1 mV to 10 mV
380 μV/V at 10 Hz to 20 kHz
450 μV/V at 30 kHz to 50 kHz
720 μV/V at 100 kHz
950 μV/V at 300 kHz to 500 kHz
From 10 mV to 0.1 V
200 μV/V at 10 Hz to 20 kHz
300 μV/V at 30 kHz to 50 kHz
500 μV/V at 100 kHz
700 μV/V at 300 kHz to 500 kHz
1.1 mV/V at 1 MHz
From 0.1 V to 1 V
140 μV/V at 10 Hz to 20 kHz
220 μV/V at 30 kHz to 50 kHz
420 μV/V at 100 kHz
710 μV/V at 300 kHz to 500 kHz
1.1 mV/V at 1 MHz
From 1 V to 10 V
42 μV/V at 10 Hz to 30 Hz
28 μV/V at 40 Hz to 30 kHz
43 μV/V at 50 kHz to 100 kHz
120 μV/V at 300 kHz
240 μV/V at 500 kHz
650 μV/V at 1MHz
From 10 V to 100 V
420 μV/V at 10 Hz to 30 Hz
300 μV/V at 40 Hz to 30 kHz
600 μV/V at 50 kHz
300 μV/V at 100 kHz
950 μV/V at 300 kHz
2.2 mV/V at 500 kHz
6.2 mV/V at 1 MHz
From 100 V to 700 V
48 μV/V at 10 Hz to 55 Hz
34 μV/V at 300 Hz to 30 kHz
41 μV/V at 50 kHz
77 μV/V at 100 kHz
280 μV/V at 200 kHz
From 700 V to 1000 V
43 μV/V at 40 Hz to 1 kHz
54 μV/V at 5 kHz
45 μV/V at 8 kHz
46 μV/V at 10 kHz
54 μV/V at 20 kHz
86 μV/V at 30 kHz

D.C. current

24 μA/A from 1 μA to 1 mA
13 μA/A from 1 mA to 0.1 A
17 μA/A from 0.1 A to 1 A
29 μA/A from 1 A to 10 A
67 μA/A from 10 A to 20 A
220 μA/A at 20 A

A.C. current

From 0.1 mA to 1 mA
150 μA/A at 10 Hz to 30 Hz
110 μA/A at 40 Hz to 1 kHz
560 μA/A at 5 kHz
2200 μA/A at 10 kHz
From 1 mA to 10 mA
140 μA/A at 10 Hz to 30 Hz
95 μA/A at 40 Hz to 1 kHz
150 μA/A at 5 kHz
310 μA/A at 10 kHz
From 10 mA to 100 mA
130 μA/A at 10 Hz to 30 Hz
88 μA/A at 40 Hz to 1 kHz
130 μA/A at 5 kHz
300 μA/A at 10 kHz
From 0.1 A to 1 A
140 μA/A at 10 Hz to 30 Hz
89 μA/A at 40 Hz to 1 kHz
140 μA/A at 5 kHz
410 μA/A at 10 kHz
From 1 A to 10 A
200 μA/A at 10 Hz to 30 Hz
130 μA/A at 40 Hz to 1 kHz
250 μA/A at 5 kHz
300 μA/A at 10 kHz
From 10 A to 20 A
280 μA/A at 10 Hz to 30 Hz
230 μA/A at 40 Hz to 1 kHz
300 μA/A at 5 kHz
390 μA/A at 10 kHz
 At 20 A
310 μA/A at 20 A at 45 Hz to 1 kHz
1000 μA/A at 20 A at 5 kHz

Resistance

15 μΩ/Ω + 20 μΩ up to 1.9 Ω
9 μΩ/Ω from 1.9 Ω to19 Ω
7 μΩ/Ω from 19 Ω to 190 Ω
4 μΩ/Ω from 190 Ω to 19 kΩ
7 μΩ/Ω from 19 kΩ to 190 kΩ
13 μΩ/Ω from 190 kΩ to 1.9 MΩ
24 μΩ/Ω from 1.9 MΩ to 19 MΩ
95 μΩ/Ω from 19 MΩ to 100 MΩ
630 μΩ/Ω from 100 MΩ to 290 MΩ
1.2 mΩ/Ω from 400 MΩ to 640 MΩ
1.8 mΩ/Ω from 640 MΩ to 1100 M Ω

DC and low frequency electrical metrology - Electrical measurement and test equipment Ammeters AC current Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of -
Multiple turn clamp on meters
0.5% from 20 A to 1 000 A

Ammeters; Appliance testers DC current Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of -
Multiple turn clamp on meters
0.2% from 20 A to 1000 A
Ground bond current testers
1.73% + 0.35 A up to 25 A
1.73% + 0.7 A from 25 A to 30 A

Ammeters; Appliance testers; Data recorders; Insulation resistance test equipment; Phase angle meters; Power analysers; Power supplies; Residual current circuit breaker testers; Residual current devices (RCD) testers AC current; DC current Comparison with a reference standard

Capability

Including calibrations performed in dedicated mobile laboratory (VOSCAL)
with Calibration and Measurement Capability of -

D.C.

24 μA/A from 1 μA to 220 μA
13 μA/A from 220 μA to 22 mA
18 μA/A from 22 mA to 220 mA
30 μA/A from 220 mA to 2.2 A
78 μA/A from 2.2 A to 11 A
220 μA/A from 11 A to 20 A

A.C.

From 1 μA to 220 μA
400 μA/A at 10 Hz to 20 Hz
200 μA/A from 20 Hz to 1 kHz
400 μA/A from 1 kHz to 5 kHz
1500 μA/A from 5 kHz to 10 kHz
From 220 μA to 220 mA
300 μA/A at 10 Hz to 20 Hz
200 μA/A from 20 Hz to 1 kHz
300 μA/A from 1 kHz to 5 kHz
1500 μA/A from 5 kHz to 10 kHz


From 220 mA to 2.2 A
300 μA/A at 20 Hz to 1 kHz
500 μA/A from 1 kHz to 5 kHz
7100 μA/A from 5 kHz to 10 kHz
From 2.2 A to 11 A
400 μA/A at 40 Hz to 1 kHz
500 μA/A from 1 kHz to 5 kHz
3700 μA/A from 5 kHz to 10 kHz
From 11 A to 20 A
500 μA/A at 45 Hz to 1 kHz
1500 μA/A from 1 kHz to 5 kHz

Appliance testers; Data recorders; Digital multimeters (DMM); Insulation resistance test equipment; Ohm meters; Phase angle meters; Power analysers; Power supplies; Residual current circuit breaker testers; Residual current devices (RCD) testers Resistance Comparison with a reference standard

Capability

Including calibrations performed in dedicated mobile laboratory (VOSCAL)
with Calibration and Measurement Capability of -

77 μΩ/Ω + 20 μΩ up to 1 Ω
50 μΩ/Ω from 1 Ω to 1.9 Ω
25 μΩ/Ω from 1.9 Ω to 10 Ω
45 μΩ/Ω from 10 Ω to 19 Ω
21 μΩ/Ω from 19 Ω to 100 Ω
15 μΩ/Ω from 100 Ω to 100 kΩ
19 μΩ/Ω from 100 kΩ to 190 kΩ
24 μΩ/Ω from 190 kΩ to 1 MΩ
120 μΩ/Ω from 1 MΩ to 1.9 MΩ
74 μΩ/Ω from 1.9 MΩ to 10 MΩ
640 μΩ/Ω from 10 MΩ to 19 MΩ
600 μΩ/Ω from 19 MΩ to 100 MΩ
6.1 mΩ/Ω from 100 MΩ to 1 GΩ

Appliance testers; Data recorders; Digital multimeters (DMM); Insulation resistance test equipment; Phase angle meters; Power analysers; Power supplies; Residual current circuit breaker testers; Residual current devices (RCD) testers; Voltmeters AC voltage; DC voltage Comparison with a reference standard

Capability

Including calibrations performed in dedicated mobile laboratory (VOSCAL)
with Calibration and Measurement Capability of -

D.C.

10 μV/V + 0.4 μV from 1 μV to 0.22 V
6 μV/V from 0.22 V to 2.2 V
5 μV/V from 2.2 V to 22 V
8 μV/V from 22 V to 1000 V

A.C.

From 10 μV to 2.2 mV
3.0 mV/V at 10 Hz to 100 kHz
6.1 mV/V from 100 kHz to 300 kHz
12 mV/V from 300 kHz to 500 kHz
13 mV/V from 500 kHz to 1 MHz
From 2.2 mV to 22 mV
500 μV/V at 10 Hz to 50 kHz
800 μV/V from 50 kHz to 100 kHz
1.6 mV/V from 100 kHz to 300 kHz
2.4 mV/V from 300 kHz to 500 kHz
3.7 mV/V from 500 kHz to 1 MHz
From 22 mV to 0.22 V
300 μV/V at 10 Hz to 50 kHz
600 μV/V from 50 kHz to 100 kHz
1 mV/V from 100 kHz to 300 kHz
1.5 mV/V from 300 kHz to 500 kHz
2.9 mV/V from 500 kHz to 1 MHz
From 0.22 V to 2.2 V
300 μV/V at 10 Hz to 50 kHz
200 μV/V from 50 kHz to 100 kHz
500 μV/V from 100 kHz to 300 kHz
1.1 mV/V from 300 kHz to 500 kHz
1.9 mV/V from 500 kHz to 1 MHz
From 2.2 V to 22 V
300 μV/V at 10 Hz to 50 kHz
100 μV/from 50 kHz to 100 kHz
300 μV/V from 100 kHz to 300 kHz
1.1 mV/V from 300 kHz to 500 kHz
1.7 mV/V from 500 kHz to 1 MHz
From 22 V to 220 V
300 μV/V at 10 Hz to 50 kHz
200 μV/V from 50 kHz to 100 kHz
900 μV/V from 100 kHz to 300 kHz
4.4 mV/V from 300 kHz to 500 kHz
8.0 mV/V from 500 kHz to 1 MHz
From 220 V to 750 V
100 μV/V at 40 Hz to 1 kHz
200 μV/V from 1 kHz to 20 kHz
600 μV/V from 20 kHz to 50 kHz
2.3 mV/V from 50 kHz to 100 kHz
From 750 V to 1000 V
100 μV/V at 40 Hz to 1 kHz
200 μV/V from 1 kHz to 20 kHz
600 μV/V from 20 kHz to 30 kHz

Appliance testers; Insulation resistance test equipment AC voltage; Resistance Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of -
Insulation resistance testers up to 1 kV
0.60% up to 100 kΩ
0.12% from 100 kΩ to 100 MΩ
0.51% from 100 MΩ to 1GΩ
0.77% from 1 GΩ to 10 GΩ
Insulation resistance testers from 1 kV to 5 kV
0.77% up to 10 GΩ
3.0% from 10 GΩ to 100 GΩ
Insulation resistance testers from 5 kV to 10 kV
1.9% up to 10 GΩ
3.0% from 10 GΩ to 100 GΩ
Output voltage for insulation resistance up to 10 kV
0.22% up to 1 kV
0.65% from 1 kV to 10 kV

Appliance testers; LCR meters; Ohm meters Resistance Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of -
0.01% from 1 mΩ to 100 mΩ

LCR meters Capacitance; Dissipation factor; Inductance; Resistance Comparison with a reference standard

Capability

Including calibrations performed in dedicated mobile laboratory (VOSCAL)
with Calibration and Measurement Capability of -

Inductance

4.2 mH/H at 100 μH to 300 μH at 1 kHz
3.0 mH/H from 300 μH to 3 mH at 1 kHz
2.2 mH/H from 3 mH to 10 H at 1 kHz
Capacitance

0.7 fF/pF for 1 pF at 1 kHz
4.5 fF/pF for 1 pF from 1 kHz to 1 MHz
15.2 fF/pF for 1 pF at 3 MHz, 5 MHz, 10 MHz & 13 MHz
0.4 fF/pF for 10 pF & 100 pF at 1 kHz
0.9 fF/pF for 10 pF & 100 pF from 1 kHz to 1 MHz
2.5 fF/pF for 10 pF & 100 pF at 3 MHz, 5 MHz, 10 MHz & 13 MHz
0.6 pF/nF for 1 nF at 1 kHz to 1 MHz
6.3 pF/nF for 1 nF at 3 MHz, 5 MHz, 10 MHz & 13 MHz
0.6 pF/nF for 10 nF at 20 Hz to 10 kHz
1.9 pF/nF for 10 nF from 10 kHz to 100 kHz
0.5 pF/nF for 100 nF at 20 Hz to 1 kHz
1.3 pF/nF for 100 nF from 1 kHz to 10 kHz
3.5 pF/nF for 100 nF from 10 kHz to 100 kHz
1.0 nF/μF for 1 μF from 20 Hz to 10 kHz
Dissipation Factor
0.0005 for 1 pF at 1.6 kHz to 1 MHz
0.0012 for 1 pF from 1 MHz to 13 MHz
0.0004 for 10 pF at 200 Hz to 1 MHz
0.0011 for 10 pF from 1 MHz to 13 MHz
0.0049 for 100 pF at 20 Hz to 1 kHz
0.0005 for 100 pF from 1 kHz to 1 MHz
0.0013 for 100 pF from 1 MHz to 13 MHz
0.0003 for 10 nF at 1 kHz
0.0004 for 100 nF at 1kHz
0.0005 for 1000 pF at 1kHz
A.C. Resistance
220 μΩ for 0.1 Ω at 1 kHz
2.9 mΩ for 1 Ω from 5 Hz to 1 MHz
2.2 mΩ for 10 Ω from 1 MHz to 13 MHz
190 mΩ for 100 Ω from 5 Hz to 1 MHz
510 mΩ for 100 Ω from 1 MHz to 13 MHz
2.8 Ω for 1 kΩ from 5 Hz to 1 MHz
4.2 Ω for 1 kΩ from 1 MHz to 13 MHz
28 Ω for 10 kΩ from 5 Hz to 1 MHz
550 Ω for 100 kΩ from 5 Hz to 1 MHz

Capacitance Direct measurement against a reference standard

0.001 μF to 10 μF

Capability

with Calibration and Measurement Capability of -
3% from 0.001 μF to 10 μF

Phase angle meters Phase angle Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of -
0.15º at 50 Hz up to 240 V and 3 A

Watt meters Active power; Power factor Comparison with a reference standard

Capability

with Calibration and Measurement Capability of -

DC power wattmeters 0.15%
AC power wattmeters 0.20%
up to 600 V and 20 A, DC to 50 Hz (to a maximum of 12 kW) at PF = 1 only

DC and low frequency electrical metrology - Electrical standards AC/DC transfer instruments Voltage AC-DC difference Direct measurement against a reference standard

Capability

Thermal converters with BNC input connectors
with Calibration and Measurement Capability of -

0.18 % from 0.5 V to 3.0 V and from 1 kHz to 1 MHz
0.26 % from 0.5 V to 3.0 V at 5, 10 & 30 MHz
0.42 % from 0.5 V to 3.0 V at 50 MHz
0.64 % from 0.5 V to 3.0 V at 70 MHz & 80 MHz

Conductance boxes; Current shunts; Precision resistors; Resistance boxes Resistance Direct measurement against a reference standard

Capability

Including DC shunts up to 100 A
with Calibration and Measurement Capability of -
0.01% from 1 mΩ to 100 mΩ

Conductance boxes; Precision resistors; Resistance boxes Resistance Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of -
at decade values of -

16 μΩ/Ω at 1 Ω
7 μΩ/Ω at 10 Ω
8 μΩ/Ω at 100 Ω
5 μΩ/Ω at 1 kΩ
3 μΩ/Ω at 10 kΩ
6 μΩ/Ω at 100 kΩ
9 μΩ/Ω at 1 MΩ
60 μΩ/Ω at 10 MΩ
230 μΩ/Ω at 100 MΩ
3.2 mΩ/Ω at 1 GΩ
within the ranges of -
77 μΩ/Ω + 5 μΩ up to 1 Ω
25 μΩ/Ω from 1 Ω to 10 Ω
22 μΩ/Ω from 10 Ω to 100 Ω
13 μΩ/Ω from 100 Ω to 100 kΩ
20 μΩ/Ω from 100 kΩ to 1 MΩ
62 μΩ/Ω from 1 MΩ to 10 MΩ
790 μΩ/Ω from 10 MΩ to 100 MΩ
5.2 mΩ/Ω from 100 MΩ to 1 GΩ
AC Resistance
220 μΩ for 0.1 Ω at 1 kHz
2.9 mΩ for 1 Ω at 1 kHz to 1 MHz
19 mΩ for 10 Ω at 1 kHz to 1 MHz
190 mΩ for 100 Ω at 1 kHz to 1 MHz
2.8 Ω for 1 kΩ at 1 kHz to 1 MHz
28 Ω for 10 kΩ at 1 kHz to 1 MHz
550 Ω for 100 kΩ at 1 kHz to 100 kHz

Inductors Inductance Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of -

4.2 mH/H at 100 μH to 300 μH at 1 kHz
3.0 mH/H from 300 μH to 3 mH at 1 kHz
2.2 mH/H from 3 mH to 10 H at 1 kHz 

Precision capacitors Capacitance Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of -

0.5fF for 1 pF at 1 kHz
5 fF for 10 pF, at 1 kHz
50 fF for 100 pF at 1 kHz
4.5 fF for 1 pF at 1 MHz
8 fF for 10 pF at 1 MHz
80 fF for 100 pF at 1 MHz
0.6 pF for 1000 pF at 1 kHz
0.9 pF for 1000 pF at 1 MHz
5 pF for 0.01 μF at 120 Hz to 1 kHz
50 pF for 0.1 μF at 120 Hz to 1 kHz
7 pF for 0.01 μF at 10 kHz
17 pF for 0.01 μF at 100 kHz
0.1 nF for 0.1 μF at 10 kHz
0.3 nF for 0.1 μF at 100 kHz
0.7 nF for 1 μF at 120 Hz
0.5 nF for 1 μF at 1 kHz
0.9 nF for 1 μF at 10 kHz

Voltage standards - E.M.F. reference devices Voltage Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of -

2.5 μV at 1 V nominal
25 μV at 10 V nominal

DC and low frequency electrical metrology - High-voltage/high-current standards and equipment High voltage test sets Current; Voltage Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of -
Output high voltage for DC test sets
0.68% from 1 kV to 40 kV
Output high voltage for AC test sets at 50 Hz
1.0% up to 2 kV
 0.8% from 2 kV to 28 kV

Dimensional metrology - Engineering equipment and precision instruments Angle plates; Bevel protractors; Bore gauges; Depth and height micrometers; Dial gauges; Electronic calipers; Electronic height and depth gauges; Engineers' parallels; External micrometers; Feeler gauges; Internal micrometers; Micrometer heads; Precision spirit levels; Sine bars and sine tables; Squares; Straight edges; Surface plates; Vernier calipers; Vernier height and depth gauges Angle (arc); Flatness; Length measurements; Parallelism; Squareness; Straightness Direct measurement; Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of -

Dial Gauges
Calibration using gauge blocks:
1.0 μm up to and including 50 mm in length.
1.5 μm greater than 50 mm and up to and including 90 mm in length.
Calibration using the Mitutoyo Checker:
1.2 μm up to and including 50 mm in length.
3.0 μm greater than 50 mm and up to and including 90 mm in length.
Calibration using the Mitutoyo micrometer head:
2.0 μm up to and including 25 mm in length.
Repeatability using the Mitutoyo Checker:
1.2 μm up to and including 50 mm in length.
1.8 μm greater than 50 mm and up to and including 90 mm in length.

External Micrometer
1.0 μm up to and including 25 mm
1.2 μm above 25 mm and up to and including 50 mm
3.0 μm above 50 mm and up to and including 1200 mm

Feeler Gauges
0.5 μm from 0.02mm and up to and including 0.15 mm
 0.7 μm from 0.15 mm and up to and including 5.0 mm  

Sine Bars and Sine Tables 
2.6μm for lengths up to 100mm
3.8μm from lengths 100mm up to  and including 300mm
5.2μm from lengths 300mm up to  and including 500mm

Surface Plates
Calibration done in the laboratory and in the field
2.8 μm up to 1 metre
3.6 μm above 1 metre and up to 2 metre
3.9 μm above 2.0 up to 2.5  metre

Straight Edges
1.8 μm up to 100 mm
2.4 μm above 100 mm to 300 mm
5 μm above 300 mm to 1000 mm
15 μm above 1000 mm to 3000 mm
25 μm above 3000 mm to 5000 mm

Squares
Squareness of Blade Edges
2.5 μm up to 300 mm
3.5 μm above 300 to 600 mm
5.8 μm above 600 to 1200 mm
Straightness of Blade Edges
2.3 μm up to 300 mm
3.2 μm above 300 to 600 mm
5.0 μm above 600 to 1200 mm
Flatness of Working Faces and Stock
2.3 μm up to 300 mm
3.2 μm above 300 to 600 mm
5.0 μm above 600 to 1200 mm
Parallelism of Working Faces and Stock
2.3 μm up to 300 mm
3.2 μm above 300 to 600 mm
5.0 μm above 600 to 1200 mm

Angle Plates
Flatness of Working Faces
3.2 μm up to 300 mm
4.6 μm above 300 to 600 mm
Parallelism of Working Faces
3.3 μm up to 300 mm
4.6 μm above 300 to 600 mm
Squareness of working Faces
3.3 μm up to 300 mm
4.6 μm above 300 to 600 mm

Bevel Protractors
Straightness of Stock Blades up to 300mm 4 μm
Straightness of Stock Face and Blades above 300mm up to 500mm 6 μm
Squareness and Parallelism up to 300 mm  4 μm
Squareness and Parallelism above 300 mm up to 500 mm 6 μm
Angle 0.2 min of arc

Engineers Parallels
Flatness of Working Faces
4 μm up to 300 mm
5 μm above 300 and up to 600 mm
8 μm above 600 and up to 1200 mm
Parallelism of Working Faces
4 μm up to 300 mm
5 μm above 300 and up to 600 mm
8 μm above 600 and up to 1200 mm
Width, Height and Length of working faces
4 μm up to 300 mm
5 μm above 300 and up to 600 mm
8 μm above 600 and up to 1200 mm

Precision Sprit Levels
0.06 div for zero test
0.5 sec for repeatability test
0.5 div for departure from nominal sensitivity
1.8 sec for deviation from average value
1.7 sec for roll error
3 μm for flatness of base

Micrometer Heads
1.8 μm for periodic and progressive error
2.0 μm for repeatability
0.2 μm for flatness of measuring face
2.2 μm for squareness of measuring face

Micrometer Setting Gauges
1.4 μm for lengths up to 25mm
1.6 μm for lengths above 25mm up to 50mm
2.0 μm for lengths above 50mm up to 100mm
3.0 μm for lengths above 100mm up to 175mm
4.0 μm for lengths above 100mm up to 200mm
5.0 μm for lengths above 200mm up to 275mm
6.0 μm for lengths above 275mm up to 375mm
8.0 μm for lengths above 375mm up to 450mm
10.0 μm for lengths above 450mm up to 600mm
15.0 μm for lengths above 600mm up to 1000mm
18.0 μm for lengths above 1000mm up to 1200mm

Depth and height micrometers
Zero Setting 2.0 μm
Traverse Error of Micrometer 2.0 μm
Flatness of Base 0.2 μm
Extension Rods
2.0 μm for lengths up to 175mm
2.5 μm for lengths above 175mm up to 250mm
2.8 μm for lengths above 250mm up to 300mm
7.0 μm for lengths above 300mm up to 400mm
8.0 μm for lengths above 400mm up to 600mm

Electronic calipers and Vernier Calipers
Flatness 2.0 μm
Depth Arm Accuracy 10.0 μm
Knife Edge Accuracy 10.0 μm
Straightness to Guiding Face 3.0 μm
Squareness to Fixed Jaw and Beam 3.0 μm
Indication Error from 0mm and up to 750mm 10.0 μm
Indication Error above 750mm up to 1500mm 15.0 μm
Parallelism internal jaws 3.0 μm
Parallelism external jaws 5.0 μm
Coincidence 6.0 μm

Bore Gauges
2.1 μm from 2mm up to 50mm
3.0 μm above 50mm up to 200mm

Electronic height and depth gauges; Vernier height and depth gauges;
Accuracy of readings up to 600mm 10.0 μm
Accuracy of readings above 600mm up to 1200mm 20.0 μm
Measuring Jaws Flatness and Parallelism to base 3.0 μm
Flatness of base 2.0 μm

Autocollimators Angle (arc) Comparison with a reference standard

Capability

with Calibration and Measurement Capability of -
1 second of arc

Coordinate length measuring machines; Electronic levels; Length measuring machines; Precision projection apparatus Diameter; Flatness; Length measurements; Parallelism; Squareness; Straightness Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of -
Coordinate length measuring machines
Calibration done in the laboratory and in the field
Volumetric Measurement:
3.0 μm up to and including 500 mm in length.
4.0 μm greater than 500 mm and up to and including 1000 mm in length.
Axis measurement using length bars:
3.0 μm up to and including 500 mm in length.
4.0 μm greater than 500 mm and up to and including 1000 mm in length.
Straightness:
4.1 μm
Squareness:
4.0 μm
Repeatability:
2.2 μm
Probe Error:
0.6 μm

Electronic Levels
Calibration done in the laboratory and in the field
0.2 arc sec for the zero test
0.2 arc sec for the repeatability test
1.5 arc sec for the deviation from average value
For a measuring range of ±4 000 arc sec

Length Measuring Machines
Calibration done in the laboratory and in the field
with Calibration and Measurement Capability of -
Scale error up to 600mm 0.0015 mm
Scale error above 600mm up to1000mm 0.0020 mm
Scale error above 1000mm up to 2000mm 0.0035 mm
Scale error above 2000mm up to 3000mm 0.005 mm
Scale error above 3000mm up to 5000mm 0.010 mm
Repeatability 0.0003 mm
Flatness of anvils 0.0002 mm
Parallelism of anvils 0.0002 mm

Precision Projection Apparatus
Calibration done in the laboratory and in the field
Error of Rotary Axis 1 min from 0 to 360°
X and Y Axis performance   0.003 mm
Magnification Error  0.005mm up to 100X

Engineers' comparators Length measurements Direct measurement against a reference standard

for compliance with AS 2372

Capability

with Calibration and Measurement Capability of -
vertical comparators (analogue type)
 2.0 μm up to 25 mm
Height setting micrometers Length measurements Direct measurement

for compliance with ISO 7863

Capability

with Calibration and Measurement Capability of -
Repeatability 0.3 μm
Flatness of Support Pads 0.5 μm
Parallelism of measuring faces to support pads 2.1 μm
Traverse of measuring column up to 300 mm 2.5 μm
Traverse of measuring column above 300mm and up to 610 mm 3.6 μm
Accuracy of Column step heights 2.0 μm
Steel rulers and measuring tapes Length measurements Comparison with a reference standard

For compliance with AS 1290.4, AS 1294 and BS 4372

Capability

with Calibration and Measurement Capability of -
Retractable steel pocket rules
0.04 mm
Tape measures
0.40 mm up to 15 m
0.65 mm above 15 m up to 30 m
(0.32 + 0.018L) mm where L is in metres for lengths above 30 m up to 50 m
(0.23 + 0.022L) mm where L is in metres for lengths above 50 m up to 100 m
Steel rulers 
0.04 mm up to 3 m
1 metre state secondary standard rigid rule
to Schedule 4 of National Measurement Regulations
0.006 mm

Dimensional metrology - Jigs, fixtures, cutting tools, machine tools, gears, splines and serrations Components and QC standards; Crimp tools; Cutting tools; Jigs and fixtures Length measurements Direct measurement

Capability

With Calibration and Measurement Capability of -
2 μm up to 25 mm
5 μm above 25 mm to 500 mm
15 μm above 500 mm to 1000 mm
50 μm above 1000 mm to  2000 mm

Angle 0.2 min of arc

Hand Crimping tools
with Calibration and Measurement Capability of -
3 μm
Dimensional metrology - Length and angle standards Area standards Length measurements Comparison with a reference standard

Capability

with Calibration and Measurement Capability of -
0.06 dm² from 10 dm² to 100 dm²

Dividing head - Rotary table Parallelism Direct measurement against a reference standard

Capability

Including on-site calibrations
with Calibration and Measurement Capability of
5 sec for error in rotation from 0 to 360°
2 sec for backlash
2 sec for repeatability
8 sec for parallelism of table
External cylindrical standards Length measurements Comparison with a reference standard

Capability

with Calibration and Measurement Capability of -
0.5 μm from 1 mm to 50 mm
0.8 μm above 50 mm to 100 mm
1 μm above 100 mm to 150 mm
1.3 μm above 150 mm to 200 mm
1.6 μm above 200 mm to 250 mm
2.0 μm above 250 mm to 300 mm

Gauge blocks and accessories Length measurements Comparison with a reference standard

for compliance with 

AS 1457, grades 0, 1 and 2

ISO 3650,
BS 4311
ASME B89.1.9

up to 1 000 mm for compliance with AS 1457, grades 0, 1 and 2

Capability

with Calibration and Measurement Capability of -
Limit deviation of Length
0.08 μm from 0.1 mm to 25 mm
0.12 μm above 25 mm to 50 mm
0.17 μm above 50 mm to 75 mm
0.21 μm above 75 mm to 90 mm
0.18 μm above 90 mm to 100 mm
0.3 μm above 100 mm to 150 mm
0.7 μm above 150 mm to 200 mm
0.8 μm above 200 mm to 300 mm
0.9 μm above 300 mm to 400 mm
1.1 μm above 400 mm to 500 mm
1.4 μm above 500 mm to 700 mm
1.9 μm above 700 mm to 1000 mm
Parallelism
0.06 μm
Flatness of Faces
0.10 μm
Internal cylindrical standards Length measurements Comparison with a reference standard

Setting rings for internal measuring instruments to 

AS 1001 and AS B294,
grades A and B

Capability

with Calibration and Measurement Capability of -
0.8 μm from 1.5 mm to 50 mm diameter
1.5 μm above 50 mm to 150 mm diameter
 2.1 μm above 150 mm to 300 mm diameter
Optical flats Flatness Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of-
0.1 μm up to 50 mm diameter
Optical parallels Flatness; Length measurements; Parallelism Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of-
0.08 μm for flatness of working faces
0.06 μm for parallelism of two flat surfaces
0.4 μm for length up to 50 mm
0.6 μm for length above 50 mm to 100 mm
Precision vee blocks Angle (arc); Diameter; Flatness; Length measurements; Parallelism Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of
Precision Vee Blocks
Flatness of working faces
4 μm up to 200mm
Mutual squareness of adjacent exterior faces (measured over height)
4 μm up to 200mm
Parallelism of Opposite faces
4 μm up to 200mm
Parallelism of Vee axis to base and side faces over length of vee
4 μm up to 200mm
Centrality of vee
4 μm up to 200mm
Equality of Semi-angles of vee flanks
5 arc seconds

Spherical standards Diameter Comparison with a reference standard

Capability

with Calibration and Measurement Capability of -
0.4 μm from 1 mm and up to and including 25 mm.
0.5 μm above 25 mm and up to and including 50 mm.
 0.06 μm from 1 mm and up to and including 50 mm for roundness.

Dimensional metrology - Limit gauges and reference standards Parallel screw plug gauges; Parallel screw ring gauges; Parallel thread gauges; Profile gauges; Taper screw plug gauges; Taper screw ring gauges Diameter; Flank angle; Length measurements; Radius; Taper Direct measurement against a reference standard

Tolerance on profile gauges not less than ±5 μm

Capability

with Calibration and Measurement Capability of -
Parallel screw plug gauges including setting plugs and screw check plug gauges
2.5 μm from 2 mm to 150 mm
Parallel screw ring gauges
7 μm from 5 mm to 150 mm
Taper screw plug gauges
3 μm from 7 mm to 100 mm
Taper screw ring gauges
9 μm from 7 mm to 100 mm
Plain gap gauges; Plain plug gauges; Plain ring gauges Diameter Direct measurement against a reference standard

Capability

with Calibration and Measurement Capability of -

Plain plug gauges
0.8 μm for sizes from 0.5mm up to 50 mm
1.5 μm for sizes from 50 mm to 150 mm
3 μm for sizes from 150 mm to 300 mm

Plain ring & gap gauges

1.5 μm from 0.5 mm to 75 mm
3 μm above 75 mm to 150 mm
5 μm above 150 mm to 300 mm

Screw diameter equipment; Screw pitch equipment Diameter; Flank angle; Minor diameter and simple pitch diameter; Thread depth; Thread form Direct measurement against a reference standard Thread Measuring Accessories to BS 5990 ;
Screw thread measuring cylinders to AS B233 ;
vee-pieces to AS 2710

Capability

with Calibration and Measurement Capability of
Screw Diameter Measuring Machines
Periodic and progressive error of micrometer head 1.8 μm
Repeatability of micrometer head 2.0 μm
Flatness of measuring face of micrometer head 0.2 μm
Squareness of measuring face of micrometer head 2.2 μm
Magnification of fiducial indicator 0.1%
Alignment of measuring faces 3.0 μm
0.4 μm for mean diameter up to 8p
Screw pitch reference standards Major diameter and simple pitch diameter; Minor diameter and simple pitch diameter Comparison with a reference standard

Capability

with Calibration and Measurement Capability of -
1 μm up to 50 mm

Taper plug gauges Diameter; Taper Comparison with a reference standard

Capability

with Calibration and Measurement Capability of -
Tapers up to 1 in 8
3 μm up to 50 mm
5 μm above 50 mm to 150 mm
Tapers from 1 in 8 to 1 in 3
5 μm up to 50 mm
8 μm above 50 mm to 150 mm

Taper ring gauges Diameter; Taper Comparison with a reference standard

Capability

with Calibration and Measurement Capability of -
Tapers up to 1 in 8
5 μm from 6 mm to 50 mm
8 μm above 50 mm to 150 mm
Tapers from 1 in 8 to 1 in 3
8 μm from 6 mm to 50 mm
10 μm from 50 mm to 150 mm

Dimensional metrology - Surface topography Cylinders; Roundness standards; Surface finish reference standards Roundness; Surface texture Comparison with a reference standard by differential measurement

Capability

Evaluation of roundness
with Calibration and Measurement Capability of -
0.06 μm from 2 mm to 300 mm
Surface finish reference standards Length measurements; Surface texture Direct measurement

Capability

with Calibration and Measurement Capability of -
0.04 μm

Dimensional metrology - Survey and alignment equipment Electronic distance measuring equipment Length measurements Direct measurement

Capability

with Calibration and Measurement Capability of -
1 mm from 0.5 m to 30 m

Flow metrology - Flow measuring devices and systemsincluding on-site calibrations Liquid meters Flow rate; Volume (and nominal flow rate) Gravimetric method; Volumetric transfer

Capability

with Calibration and Measurement Capability of
0.07 % of reading with a minimum test volume of 100 mL from 100 mL /h to  400 L/min
 including on-site calibration for Volume
0.14 % of reading with a minimum test volume of 1 L from 1 L/min to 200 L/min









Force metrology - Force measuring and testing equipment Force gauges Force in compression Comparison measurement with reference load cell

Axial type force gauges

Capability

with Calibration and Measurement Capability of -
0.03% up to 500 N 

Force in tension Comparison measurement with reference load cell

Axial type force gauges

Capability

with Calibration and Measurement Capability of -
0.01% or 0.04 N (whichever is greater) up to 1 000 N 

High frequency electrical metrology - Communications, electromagnetic field strength and EMC test equipment Amplifiers; Attenuators; Communications systems; Data transmission measuring equipment; Electrical noise and interference measuring equipment; Electromagnetic field hazard meters and warning indicators; Harmonic emission compliance test systems; Impedance and reflection measuring equipment; Line impedance stabilisation networks (LISN); Line transmission measuring equipment; Power measuring equipment; Radio transmission measuring equipment; Spectrum analysers; Waveguide and coaxial components Attenuation; Insertion loss; Internal reference impedance resistance Comparison with a reference standard

Capability

Including calibrations performed in dedicated mobile laboratory (VOSCAL)
with Calibration and Measurement Capability of -

For attenuation above 40 dB using a network analyser, the
laboratory's capability is limited to step attenuators or similar devices,
such that individual elements can be selectively measured

Using measuring receiver systems

From 5 Hz to 1 MHz
0.015 dB at +20 dBm to -40 dBm
0.021 dB from -40 dBm to -80 dBm
0.025 dB from -80 dBm to -110 dBm
From 1 MHz to 2.5 MHz
0.03 dB at +20 dBm to -40 dBm
0.06 dB from -40 dBm to -90 dBm
0.12 dB from -90 dBm to -110 dBm
From 2.5 MHz to 1.3 GHz
0.09 dB at +20 dBm to -10 dBm
0.11 dB from -10 dBm to -20 dBm
0.13 dB from -20 dBm to -30 dBm
0.16 dB from -30 dBm to -40 dBm
0.19 dB from -40 dBm to -50 dBm
0.22 dB from -50 dBm to -60 dBm
0.25 dB from -60 dBm to -70 dBm
0.29 dB from -70 dBm to -80 dBm
0.32 dB from -80 dBm to -90 dBm
0.35 dB from -90 dBm to -100 dBm
0.38 dB from -100 dBm to -110 dBm
0.44 dB from -110 dBm to -120 dBm
0.54 dB from -120 dBm to -127 dBm
From 1.3 GHz to 18 GHz
0.13 dB at +20 dBm to -10 dBm
0.15 dB from -10 dBm to -20 dBm
0.16 dB from -20 dBm to -30 dBm
0.19 dB from -30 dBm to -40 dBm
0.21 dB from -40 dBm to -50 dBm
0.24 dB from -50 dBm to -60 dBm
0.26 dB from -60 dBm to -70 dBm
0.31 dB from -70 dBm to -80 dBm
0.34 dB from -80 dBm to -90 dBm
0.42 dB from -90 dBm to -100 dBm
0.45 dB from -100 dBm to -110 dBm
0.50 dB from -110 dBm to -120 dBm
0.55 dB from -120 dBm to -127 dBm
From 18 GHz to 26.5 GHz
0.18 dB at +20 dBm to -10 dBm
0.19 dB from -10 dBm to -20 dBm
0.21 dB from -20 dBm to -30 dBm
0.23 dB from -30 dBm to -40 dBm
0.25 dB from -40 dBm to -50 dBm
0.27 dB from -50 dBm to -60 dBm
0.29 dB from -60 dBm to -70 dBm
0.33 dB from -70 dBm to -80 dBm
0.36 dB from -80 dBm to -90 dBm
0.44 dB from -90 dBm to -100 dBm
0.47 dB from -100 dBm to -110 dBm
0.51 dB from -110 dBm to -120 dBm
0.56 dB from -120 dBm to -127 dBm
From 26.5 GHz to 40 GHz
0.40 dB at -10 dBm to -90 dBm
From 40 GHz to 50 GHz
0.67 dB at -10 dBm to -60 dBm
0.83 dB from -60 dBm to -90 dBm

Using VNA systems

From 5 Hz to 45 MHz
0.14 dB from 0 dB to 10 dB
0.14 dB from 10 dB to 30 dB
0.14 dB from 30 dB to 40 dB
0.14 dB from 40 dB to 70 dB
0.14 dB from 70 dB to 90 dB
0.14 dB from 90 dB to 100 dB
0.14 dB from 100 dB to 120 dB
From 45 MHz to 2 GHz
0.04 dB from 0 dB to 10 dB
0.09 dB from 10 dB to 30 dB
0.24 dB from 30 dB to 40 dB
0.33 dB from 40 dB to 70 dB
0.40 dB from 70 dB to 90 dB
0.43 dB from 90 dB to 100 dB
0.63 dB from 100 dB to 120 dB
From 2 GHz to 18 GHz
0.08 dB from 0 dB to 10 dB
0.08 dB from 10 dB to 30 dB
0.10 dB from 30 dB to 40 dB
0.18 dB from 40 dB to 70 dB
0.26 dB from 70 dB to 90 dB
0.26 dB from 90 dB to 100 dB
0.35 dB from 100 dB to 120 dB
From 18 GHz to 26.5 GHz
0.17 dB from 0 dB to 10 dB
0.18 dB from 10 dB to 30 dB
0.24 dB from 30 dB to 40 dB
0.59 dB from 40 dB to 70 dB
0.76 dB from 70 dB to 90 dB
0.78 dB from 90 dB to 100 dB
1.0 dB from 100 dB to 120 dB
From 26.5 GHz to 40 GHz
0.17 dB from 0 dB to 10 dB
0.25 dB from 10 dB to 30 dB
0.48 dB from 30 dB to 40 dB
0.91 dB from 40 dB to 70 dB
1.09 dB from 70 dB to 90 dB
1.2 dB from 90 dB to 100 dB
1.6 dB from 100 dB to 120 dB
From 40 GHz to 50 GHz
0.29 dB from 0 dB to 10 dB
0.66 dB from 10 dB to 30 dB
1.8 dB from 30 dB to 40 dB
2.8 dB from 40 dB to 70 dB
3.2 dB from 70 dB to 90 dB
3.5 dB from 90 dB to 100 dB
5.0 dB from 100 dB to 120 dB

Internal reference impedance resistance; Reflection coefficient Comparison with a reference standard; Direct measurement by electrical input

Capability

Including calibrations performed in dedicated mobile laboratory (VOSCAL)
with Calibration and Measurement Capability of -

From 20 Hz to 45 MHz
(± 0.005 to ± 0.007) lin and (± 2.1 to ± 180) deg from (0.001 to 0.01) lin
(± 0.006 to ± 0.008) lin and (± 2.8 to ± 3.8) deg from (0.01 to 0.1) lin
(± 0.006 to ± 0.019) lin and (± 1.1 to ± 3.8) deg from (0.1 to 1.0) lin
From 45 MHz to 18 GHz
(± 0.005 to ± 0.029) lin and (± 24.0 to ± 180) deg from (0.001 to 0.01) lin
(± 0.005 to ± 0.029) lin and (± 7.3 to ± 29) deg from (0.01 to 0.1) lin
(± 0.005 to ± 0.029) lin and (± 1.1 to ± 9.9) deg from (0.1 to 1.0) lin
From 18 GHz to 26.5 GHz
(± 0.011 to ± 0.028) lin and (± 12.4 to ± 180) deg from (0.001 to 0.01) lin
(± 0.011 to ± 0.028) lin and (± 14.0 to ± 15.5) deg from (0.01 to 0.1) lin
(± 0.011 to ± 0.028) lin and (± 8.4 to ± 11.0) deg(0.1 to 1.0) lin
From 26.5 GHz to 50 GHz
(± 0.016 to ± 0.035) lin and (± 54 to ± 180) deg from (0.001 to 0.01) lin
(± 0.016 to ± 0.035) lin and (± 17.8 to ± 180) deg from (0.01 to 0.1) lin
(± 0.016 to ± 0.035) lin and (± 9.7 to ± 12.3) deg from (0.1 to 1.0) lin

Communications systems; Data transmission measuring equipment; Electrical noise and interference measuring equipment; Line transmission measuring equipment; Power measuring equipment; Radio transmission measuring equipment; Spectrum analysers Frequency Comparison with a reference standard; Comparison with a reference standard by differential measurement; Comparison with a reference standard by substitution measurement; Direct measurement by electrical input

Capability

Including calibrations performed in dedicated mobile laboratory (VOSCAL)
with Calibration and Measurement Capability of -
Frequency characteristics

5 parts in 1012 from 1 mHz to 12.4 GHz
2 parts in 1010 from 12.4 GHz to 46 GHz
8 parts in 108 from 46 GHz to 50 GHz

Frequency standards
5 parts in 1012 from 1 mHz to 10 MHz in main laboratory
7 parts in 1011 from 1 mHz to 10 MHz in VOSCAL laboratory

Data transmission measuring equipment Voltage deviation Comparison with a reference standard by differential measurement

Capability

Including calibrations performed in dedicated mobile laboratory (VOSCAL)
with Calibration and Measurement Capability of --
0.13 % from 1 mV to 4 V

Power measuring equipment Power Comparison with a reference standard

Capability

with Calibration and Measurement Capability of -

including calibrations at VOSCAL mobile facility

from +20 dBm to -30 dBm at the reference power level appropriate to the sensor
absolute power calibration factor 

0.37 % at 1 mW and 50 MHz
1.3 % from 9 kHz to 18 GHz
2.0 % from 18 GHz to 26.5 GHz
2.3 % from 26.5 GHz to 40 GHz
3.7 % from 40 GHz to 50 GHz

Mass - Determination of mass and calibration of weighing devices Mass standards Mass Gravimetric measurement against reference mass

Capability

with Calibration and Measurement Capability of -

6 μg from 1 mg to 1 g

8 μg at 2 g

20 μg at 5 g

30 μg at 10 g

40 μg at 20 g

0.1 mg at 50 g

0.2 mg at 100 g

0.3 mg at 200 g

0.5 mg at 500 g

1.0 mg at 1 kg

4 mg at 2 kg

7 mg at 5 kg

10 mg at 10 kg

20 mg at 20 kg

500 mg at 25 kg

3 g from 50 kg to 100 kg

7 g at 250 kg

22 g at 500 kg

50 g at 1 000 kg

5 in 104 up to 25 t

Mass - Determination of mass and calibration of weighing devicesincluding on site calibrations Industrial weighing devices; Precision laboratory balances Mass Gravimetric measurement against reference mass

Capability

Including on-site calibrations

with Calibration and Measurement Capability of -

Precision laboratory balances 
1.3 in 106 or 32 μg (whichever is greater) up to 32 kg
Industrial balances 
1 in 105 up to 1500 kg

Pressure metrology - Pressure and vacuum measuring equipmentincluding on-site calibrations Digital pressure gauges; Manometers; Mechanical pressure gauges; Pressure control devices; Pressure gauges; Pressure recorders; Pressure transducers Gauge pressure By pressure calibrator; Comparison with dead weight tester Pressure and Vacuum gauges Including test gauges AS 1349 and MSA Test Method 2
Pressure transducers and recorders MSA Test Method 1
Self indicating and electrical transducers with dc voltage or dc current output
Temperature range for on-site calibrations 15 °C to 25 °C

Capability

Including on-site calibrations 

with Calibration and Measurement Capability of -
0.006 % or 2 Pa (whichever is the greater) from -100 kPa to - 1 kPa
2.4 Pa from -1 kPa to 1 kPa
0.006% or 2 Pa (whichever is the greater) from 1 kPa to 100 kPa
0.005% from 100 kPa to 700 kPa
0.009% from 700 kPa to 110000 kPa
0.012% from 110 MPa to 500 MPa

On-site calibration
30 Pa from -100 kPa to - 1 kPa
2.4 Pa from -1 kPa  to 1 kPa
0.1% or 33 Pa (whichever is greater) from 1 kPa to 16000 kPa
59 kPa  from 16000 kPa to 100000 kPa

Pressure metrology - Pressure and vacuum measuring equipmentincluding on-site calibrations Barometers; Digital pressure gauges; Manometers; Mechanical pressure gauges; Pressure control devices; Pressure recorders; Pressure transducers; Vacuum gauges Absolute pressure By pressure calibrator; Comparison with dead weight tester; Comparison with reference instrument Pressure and vacuum gauges including test gauges AS 1349 and MSA Test Method 2
Pressure transducers and recorders MSA Test Method 1
Self indicating and electrical transducers with dc voltage or dc current output
Temperature range for on-site calibrations 15 °C to 25 °C

Capability

including on-site calibrations

with Calibration and Measurement Capability of -

30 Pa from 5 kPa to 50 kPa,
8 Pa from 50 kPa to 110 kPa,
0.01% from 110 kPa to 110 MPa

Onsite Calibration
33 Pa from 5 kPa to 50 kPa
8 Pa from 50 kPa to 110 kPa
0.01% from 110 kPa to 16 MPa


Pressure metrology - Pressure standards Pressure calibrators - Non-dead weight Gauge pressure Comparison with dead weight tester

Capability

with Calibration and Measurement Capability of -

0.006% or 2 Pa(whichever is the greater) from -100 kPa to -1 kPa

0.35 Pa from -1 kPa to 1 kPa

0.006% or 2 Pa(whichever is the greater) from 1 kPa to 100 kPa

0.005% from 100 kPa to 700 kPa

0.009% from 700 kPa to 110000 kPa

0.012% from 110 MPa to 500 MPa

Temperature metrology - Ancillary temperature measuring equipment Digital voltmeters (DVM) and digital multimeters (DMM); Multi-channel thermocouple data recorders Volt to temperature conversion Direct measurement by electrical input

Capability

with Calibration and Measurement Capability of -

Digital voltmeters
50 μV/V + 1 μV up to 1 V
10 μV/V + 1 μV from 1 V to 1 000 V
Indicators, recorders and controllers
0.1% of full scale reading

Portable potentiometers; Process calibrators; Resistance bridges Resistance to temperature conversion Direct measurement by electrical input

Capability

with Calibration and Measurement Capability of -

Portable potentiometers and temperature/instrument process calibrators
0.02% of reading + 3 μV

(including simulated input and output of (base metal) and (rare metal) thermocouple signals with internal and/or external ACJC as per IEC 60584))
Resistance bridges
0.01% from 1 mΩ to 100 mΩ
0.02% above 100 mΩ to 1 Ω
0.005% above 1 Ω to 10 kΩ
0.02% above 10 kΩ to 1 MΩ
0.05% above 1 MΩ to 10 MΩ
0.1% above 10 MΩ to 100 MΩ
0.7% above 100 MΩ to 1 GΩ

(including simulated input and output of resistance temperature detector (RTD) signals as per BS EN 60751)
Type R extension wire; Type S extension wire Volt to temperature conversion Direct measurement by electrical input

Extension wires for rare metal and base metal thermocouples 

Capability

with aCalibration and Measurement Capability  of -
0.5 μV from 0°C to 40ºC

Temperature metrology - Humidity measuring equipment Relative humidity sensors Temperature Comparison with a reference standard

Capability

with Calibration and Measurement Capability of -

1.0ºC from -10°C to 15ºC
0.2ºC above 15°C to 45ºC
0.5ºC above 45°C to 65ºC

Relative humidity (RH) Comparison with a reference standard; To be determined

Capability

with Calibration and Measurement Capability of -
2% RH from 20°C to 24°C and in the range from 11% RH to 97% RH

Temperature metrology - Non-contact temperature measuring equipment Radiation pyrometers; Thermal imaging systems Temperature Comparison with a reference standard

Capability

with Calibration and Measurement Capability of -

Radiation Pyrometers

with an emissivity of 0.95 or 1.00
0.8 °C from -40 °C to 0 °C
1.0 °C above 0° C to 280 °C
1.8 °C above 280° C to 500 °C
3.0 °C above 500 °C to 800 °C


Thermal Imagers

with an emissivity of 0.95 or 1.00
1.9 °C from -15°C to 0°C
1.5 °C above 0°C to 60°C
8.0 °C above 60°C to 260°C





Temperature metrology - Temperature measuring equipment Metallic resistance thermometers Resistance over oC range Direct temperature and electrical measurement against reference standard

Capability

with Calibration and Measurement Capability  of -

Both RTDS on their own and/or  with a Thermometer as a system

0.05°C from -55°C to 300°C
0.3°C above 300°C to 350°C
0.4 °C from 350 °C to 660 °C


Temperature metrology - Temperature measuring equipmentincluding on site calibrations Base metal thermocouples; Bimetallic systems; Digital temperature measuring systems; Filled metal systems; Liquid in glass (LIG) thermometers; Rare metal thermocouples; Surface probes; Vapour pressure thermometers Temperature Measurement against reference standard

Capability

with Calibration and Measurement Capability of -
Rare metal thermocouples (with probe only and/or with thermometer as a system)

(5 + 0.002E) μV from 0°C to 1550°C

Base metal thermocouples (with probe only  and with thermometer as a system) including on site calibrations
0.1°C from -55°C to 180°C
1.0°C above 180°C to 500°C
2°C above 500°C to 950°C
3°C above 950°C to 1250°C
Surface probes (with probe only  and/or with thermometer as a system) 
0.7°C from 0°C to 20°C
1.2°C above 20°C to 300°C
2.2°C above 300°C to 500°C
Liquid-in-glass thermometers and digital temperature indicator systems
0.1°C from -55°C to 0°C
0.01°C at 0°C
0.05°C above 0°C to 180°C
0.2°C above 180°C to 300°C
Vapour pressure thermometers, Filled metal and Bimetallic systems 
0.2°C from -55°C to 20°C
1°C above 20°C to 180°C
2°C above 180°C to 650°C

Temperature metrology - Temperature standards and reference equipment Dry block calibrators; Reference baths Temperature Direct measurement using a reference standard

AS 2853

Capability

Controlled thermal calibration wells
with Calibration and Measurement Capability of -

0.2ºC from -55°C to 180ºC
0.5ºC above 180°C to 350ºC
1ºC above 350°C to 660ºC
2ºC above 660°C to 950ºC
4ºC above 950°C to 1250ºC

Rare metal thermocouples mV per oC Direct measurement using a reference standard

0°C to 1550°C

Capability

with Calibration and Measurement Capability of -

Both B, R and S Thermocouples on their own  and with a Thermometer as a system

(5 + 0.002E) μV  

Temperature metrology - Verification of controlled enclosuresincluding on site calibrations Autoclaves and sterilising ovens; Baths; Environmental chambers - Temperature; Freezers; Furnaces; Incubators; Ovens Temperature By methods of SAE AMS 2750; Direct temperature measurement AS 2853, BAC 5621 clauses 10.2 - 10.3 and AMS 2750E clauses 3.4 - 3.5)

Capability

Including on site calibrations

with Calibration and Measurement Capability of -

Ovens and Furnaces, Environmental Chambers (Temperature)
0.2°C from 0°C to 180°C
1°C above 180°C to 500°C
2°C above 500°C to 950°C
4°C above 950°C to 1550°C
Industrial freezers, Environmental Chambers (Temperature)
0.2°C from -55°C to 0°C

Environmental chambers - Humidity Humidity By temperature and humidity measurement

Capability

Including on site calibrations

with Calibration and Measurement Capability of -

3% RH from 20% RH to 90% RH and 15ºC to 35ºC

Time and frequency metrology - Frequency and time standards Signal sources Frequency; Modulation; Sweep Direct measurement

Capability

including calibrations at VOSCAL mobile facility
with Calibration and Measurement Capability of -

Frequency characteristics

5 parts in 1012 from 1 mHz to 12.4 GHz
2 parts in 1010 from 12.4 GHz to 46 GHz
8 parts in 108 from 46 GHz to 50 GHz

Output characteristics

From 5 Hz to 1 MHz
0.015 dB at +20 dBm to -40 dBm
0.021 dB from -40 dBm to -80 dBm
0.025 dB from -80 dBm to -110 dBm
From 1 MHz to 2.5 MHz
0.03 dB at +20 dBm to -40 dBm
0.06 dB from -40 dBm to -90 dBm
0.12 dB from -90 dBm to -110 dBm
From 2.5 MHz to 1.3 GHz
0.09 dB at +20 dBm to -10 dBm
0.11 dB from -10 dBm to -20 dBm
0.13 dB from -20 dBm to -30 dBm
0.16 dB from -30 dBm to -40 dBm
0.19 dB from -40 dBm to -50 dBm
0.22 dB from -50 dBm to -60 dBm
0.25 dB from -60 dBm to -70 dBm
0.29 dB from -70 dBm to -80 dBm
0.32 dB from -80 dBm to -90 dBm
0.35 dB from -90 dBm to -100 dBm
0.38 dB from -100 dBm to -110 dBm
0.44 dB from -110 dBm to -120 dBm
0.54 dB from -120 dBm to -127 dBm
From 1.3 GHz to 18 GHz
0.13 dB at +20 dBm to -10 dBm
0.15 dB from -10 dBm to -20 dBm
0.16 dB from -20 dBm to -30 dBm
0.19 dB from -30 dBm to -40 dBm
0.21 dB from -40 dBm to -50 dBm
0.24 dB from -50 dBm to -60 dBm
0.26 dB from -60 dBm to -70 dBm
0.31 dB from -70 dBm to -80 dBm
0.34 dB from -80 dBm to -90 dBm
0.42 dB from -90 dBm to -100 dBm
0.45 dB from -100 dBm to -110 dBm
0.50 dB from -110 dBm to -120 dBm
0.55 dB from -120 dBm to -127 dBm
From 18 GHz to 26.5 GHz
0.18 dB at +20 dBm to -10 dBm
0.19 dB from -10 dBm to -20 dBm
0.21 dB from -20 dBm to -30 dBm
0.23 dB from -30 dBm to -40 dBm
0.25 dB from -40 dBm to -50 dBm
0.27 dB from -50 dBm to -60 dBm
0.29 dB from -60 dBm to -70 dBm
0.33 dB from -70 dBm to -80 dBm
0.36 dB from -80 dBm to -90 dBm
0.44 dB from -90 dBm to -100 dBm
0.47 dB from -100 dBm to -110 dBm
0.51 dB from -110 dBm to -120 dBm
0.56 dB from -120 dBm to -127 dBm
From 26.5 GHz to 40 GHz
0.40 dB at -10 dBm to -90 dBm
From 40 GHz to 50 GHz
0.67 dB at -10 dBm to -60 dBm
0.83 dB from -60 dBm to -90 dBm

Modulation characteristics

AM Depth
Carrier 0.15 kHz to 26.5 GHz
10% to 90% Modulation
0.93% from 20 Hz to 400 Hz
0.49% from 400 Hz to 10 kHz
1.71% from 10 kHz to 100k Hz
FM Deviation
0.15 MHz to 26.5 GHz
1.2% Peak deviation 1 to 320 kHz,
Modulation frequencies 10 Hz to 100 kHz
1.2% from 150 kHz to 26.5 GHz

Sweep characteristics

5 parts in 1012 from 1 mHz to 12.4 GHz
2 parts in 1010 from 12.4 GHz to 46 GHz
8 parts in 108 from 46 GHz to 50 GHz

Output characteristics

From 5 Hz to 1 MHz
0.015 dB at +20 dBm to -40 dBm
0.021 dB from -40 dBm to -80 dBm
0.025 dB from -80 dBm to -110 dBm
From 1 MHz to 2.5 MHz
0.03 dB at +20 dBm to -40 dBm
0.06 dB from -40 dBm to -90 dBm
0.12 dB from -90 dBm to -110 dBm
From 2.5 MHz to 1.3 GHz
0.09 dB at +20 dBm to -10 dBm
0.11 dB from -10 dBm to -20 dBm
0.13 dB from -20 dBm to -30 dBm
0.16 dB from -30 dBm to -40 dBm
0.19 dB from -40 dBm to -50 dBm
0.22 dB from -50 dBm to -60 dBm
0.25 dB from -60 dBm to -70 dBm
0.29 dB from -70 dBm to -80 dBm
0.32 dB from -80 dBm to -90 dBm
0.35 dB from -90 dBm to -100 dBm
0.38 dB from -100 dBm to -110 dBm
0.44 dB from -110 dBm to -120 dBm
0.54 dB from -120 dBm to -127 dBm

From 1.3 GHz to 18 GHz
 0.13 dB at +20 dBm to -10 dBm
 0.15 dB from -10 dBm to -20 dBm
 0.16 dB from -20 dBm to -30 dBm
 0.19 dB from -30 dBm to -40 dBm
 0.21 dB from -40 dBm to -50 dBm
 0.24 dB from -50 dBm to -60 dBm
 0.26 dB from -60 dBm to -70 dBm
 0.31 dB from -70 dBm to -80 dBm
 0.34 dB from -80 dBm to -90 dBm
 0.42 dB from -90 dBm to -100 dBm
 0.45 dB from -100 dBm to -110 dBm
 0.50 dB from -110 dBm to -120 dBm
 0.55 dB from -120 dBm to -127 dBm
From 18 GHz to 26.5 GHz
 0.18 dB at +20 dBm to -10 dBm
 0.19 dB from -10 dBm to -20 dBm
 0.21 dB from -20 dBm to -30 dBm
 0.23 dB from -30 dBm to -40 dBm
 0.25 dB from -40 dBm to -50 dBm
 0.27 dB from -50 dBm to -60 dBm
 0.29 dB from -60 dBm to -70 dBm
 0.33 dB from -70 dBm to -80 dBm
 0.36 dB from -80 dBm to -90 dBm
 0.44 dB from -90 dBm to -100 dBm
 0.47 dB from -100 dBm to -110 dBm
 0.51 dB from -110 dBm to -120 dBm
 0.56 dB from -120 dBm to -127 dBm
From 26.5 GHz to 40 GHz
 0.40 dB at -10 dBm to -90 dBm
From 40 GHz to 50 GHz
 0.67 dB at -10 dBm to -60 dBm
 0.83 dB from -60 dBm to -90 dBm


Time and frequency metrology - Frequency, time and waveform measuring equipment Clocks and timers; Time interval meters Time interval Comparison with a reference standard

Capability

with Calibration and Measurement Capability of -
Time interval meters
1 in 109 + 100 ns from 1 μs to 1 000 s
Clocks and watches
0.04 s from 1 min to 24 h
RCD testers, trip time
0.40 ms up to 500 ms
0.75 ms from 500 ms to 2 s

Counters; Frequency meters; Time interval meters Frequency; Time interval Comparison with a reference standard

Capability

including calibrations at VOSCAL mobile facility
with Calibration and Measurement Capability of -

Counters

5 parts in 1012 from 1 mHz to 12.4 GHz
2 parts in 1010 from 12.4 GHz to 46 GHz
8 parts in 108 from 46 GHz to 50 GHz

Time interval meters 

1 ns or 5 parts in 1012, which ever is the greater, from 10 ns to 105 seconds.

Frequency standards 

5 parts in 1012 

Frequency analysers; Waveform measuring instruments Distortion; Frequency; Time interval; Voltage Comparison with a reference standard

Capability

including calibrations at VOSCAL mobile facility
with Calibration and Measurement Capability of -

Frequency characteristics

5 parts in 1012 from 1 mHz to 12.4 GHz
2 parts in 1010 from 12.4 GHz to 46 GHz
8 parts in 108 from 46 GHz to 50 GHz

Input characteristics

From 10 μV to 2.2 mV
3.0 mV/V at 10 Hz to 100 kHz
6.1 mV/V from 100 kHz to 300 kHz
12 mV/V from 300 kHz to 500 kHz
13 mV/V from 500 kHz to 1 MHz
From 2.2 mV to 22 mV
500 μV/V at 10 Hz to 50 kHz
800 μV/V from 50 kHz to 100 kHz
1.6 mV/V from 100 kHz to 300 kHz
2.4 mV/V from 300 kHz to 500 kHz
3.7 mV/V from 500 kHz to 1 MHz
From 22 mV to 0.22 V
300 μV/V at 10 Hz to 50 kHz
600 μV/V from 50 kHz to 100 kHz
1 mV/V from 100 kHz to 300 kHz
1.5 mV/V from 300 kHz to 500 kHz
2.9 mV/V from 500 kHz to 1 MHz
From 0.22 V to 2.2 V
300 μV/V at 10 Hz to 50 kHz
200 μV/V from 50 kHz to 100 kHz
500 μV/V from 100 kHz to 300 kHz
1.1 mV/V from 300 kHz to 500 kHz
1.9 mV/V from 500 kHz to 1 MHz
From 2.2 V to 22 V
300 μV/V at 10 Hz to 50 kHz
100 μV/from 50 kHz to 100 kHz
300 μV/V from 100 kHz to 300 kHz
1.1 mV/V from 300 kHz to 500 kHz
1.7 mV/V from 500 kHz to 1 MHz
From 22 V to 220 V
300 μV/V at 10 Hz to 50 kHz
200 μV/V from 50 kHz to 100 kHz
900 μV/V from 100 kHz to 300 kHz
4.4 mV/V from 300 kHz to 500 kHz
8.0 mV/V from 500 kHz to 1 MHz
From 220 V to 750 V
100 μV/V at 40 Hz to 1 kHz
200 μV/V from 1 kHz to 20 kHz
600 μV/V from 20 kHz to 50 kHz
2.3 mV/V from 50 kHz to 100 kHz
From 750 V to 1000 V
100 μV/V at 40 Hz to 1 kHz
200 μV/V from 1 kHz to 20 kHz
600 μV/V from 20 kHz to 30 kHz

Tming characteristics

1 ns or 5 parts in 1012, which ever is the greater, from 10 ns to 105 seconds

Distortion

0.007% absolute at < 0.05% at 20 Hz to 20 kHz
13.5% of reading at > 0.05% to < 10% at 20 Hz to 20 kHz
0.027% absolute at < 0.1% at 20 kHz to 50 kHz
26.8% of reading at > 0.1% to < 10% at 20 Hz to 20 kHz
0.05% absolute at < 0.18% at 50 kHz to 100 kHz
26.8% of reading at > 0.18% to < 10% at 50 Hz to 100 kHz

.

Stroboscopes; Tachometers Rotational speed Comparison with a reference standard

Capability

with Calibration and Measurement Capability of -
Stroboscopes
 0.12 rpm from 6 rpm to 99 rpm
 1.2 rpm from 100 rpm to 999 rpm
 3.0 rpm from 1 000 rpm to 30 000 rpm
Tachometers
 0.02 rpm from 6 rpm to 99 rpm
 0.2 rpm from 100 rpm to 999 rpm
 2 rpm from 1 000 rpm to 99 000 rpm

Torque - Torque measuring and testing equipment Torque transducers; Torque wrenches Torque Comparison with a reference standard

ISO 6789-2

Torque wrenches from 0.5 N.m to 1300 N.m clockwise and anti-clockwise

Torque transducers including torque calibrating devices from 0.5 N.m to 1000 N.m

Capability

with Calibration and Measurement Capability of -
Torque wrenches
 0.9%
Torque transducers including torque calibrating devices
0.012% 0.5 N.m to 115 N.m
0.03% from 115 N.m to 1 000 N.m

Volume and density - Determination of density Density of liquids kg/m3 Gravimetric method

Capability

with Calibration and Measurement Capability of -

0.06 kg/mfrom 995 kg/m3 to 1000 kg/m3

Volume and density - Laboratory volumetric glassware and measures Pipettes; Piston operated volumetric apparatus (POVA); Standard measures - < 50 L; Volumetric glassware and measures Volume Gravimetric method

Calibration and verification of piston operated pipetters
by the method of ISO 8655-2

Capability

with Calibration and Measurement Capability of -
Pipettes, burettes, volumetric flasks and graduated cylinders 
0.3 μL at 200 μL
1.1 μL at 2 mL
6 μL at 20 mL
22 μL at 200 mL
97 μL at 500 mL
Industrial volumetric proving measures
using volumetric methods 0.02% up to 2000 L
using gravimetric methods 0.008% up to 10000 L
Volume standard
0.01% up to 500 L
Inspection standards
0.02% up to 25 L
Piston Operated Volumetric Apparatus, pipettes (POVAS)
0.08 μL at 20 μL
22 μL at 200 mL
97 μL at 500 mL

The only data displayed is that deemed relevant and necessary for the clear description of the activities and services covered by the scope of accreditation.

Grey text appearing in a SoA is additional freetext providing further refinement or information on the data in the preceding line entry.