Home / TR Calibration Sydney Facility

TR Pty Ltd (Trading as TR Calibration)

Site

TR Calibration Sydney Facility

Accreditation No.

116

Site No.

109

Date of Accreditation

12 Jan 1954

Address

41 Enterprise Circuit
Prestons, NSW 2170
Australia

trcalibration.com.au

Contact

Mr Patrick Hutchinson P: +61 0475006755

Availability

Services available to external clients

Scope of Accreditation

Print scopes

TR Calibration Sydney Facility

ISO/IEC 17025 (2017)

Calibration

The uncertainty of measurement is reported as an expanded uncertainty having a level of confidence of 95% unless stated otherwise

Service	Product	Determinant	Technique	Procedure	Limitations
DC and low frequency electrical metrology - Electrical instrument calibrators	Instrument calibrators	DC voltage	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 0.4 μV up to 100 mV 2.5 μV/V at 1 V and 10 V 4.0 μV/V from 100 mV to 100 V 8.5 μV/V above 100 V to 1100 V 0.2% above 1100 V to 10000 V
		Resistance	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 10 μΩ/Ω from 1 mΩ to 100 mΩ 4 μΩ/Ω above 100 mΩ to 10 Ω 1.5 μΩ/Ω above 10 Ω to 10 kΩ 2.5 μΩ/Ω above 10 kΩ to 100 kΩ 4 μΩ/Ω above 100 kΩ to 1 MΩ 40 μΩ/Ω above 1 MΩ to 100 MΩ 0.17% above 100 MΩ to 10 GΩ 0.27% above 10 GΩ to 1 TΩ
		AC current	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 290 μA/A from 100 μA to 200 μA from 10 Hz to <1 kHz 310 μA/A from 100 μA to 200 μA at 1 kHz 335 μA/A from 100 μA to 200 μA at 5 kHz 380 μA/A from 100 μA to 200 μA at 10 kHz 285 μA/A above 200 μA to 2 mA from 10 Hz to <1 kHz 290 μA/A above 200 μA to 2 mA at 1 kHz 320 μA/A above 200 μA to 2 mA at 5 kHz 355 μA/A above 200 μA to 2 mA at 10 kHz 70 μA/A above 2 mA to 20 A from 10 Hz to 1 kHz 190 μA/A above 2 mA to 20 A at 5 kHz 580 μA/A above 2 mA to 20 A at 10 kHz 170 μA/A above 20 A to 100 A from 10 Hz to 1 kHz 580 μA/A from 10 mA to 300 mA at 30 kHz
		DC current	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 0.1% from 20 pA to 200 pA 0.05% above 200 pA to 2 nA 0.02% above 2 nA to 10 μA 10 μA/A above 10 μA to 2 A 15 μA/A above 2 A to 20 A 65 μA/A above 20 A to 100 A
		AC voltage	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 275 μV/V at 2 mV at 20 Hz 250 μV/V at 2 mV from 40 Hz to 50 kHz 260 μV/V at 2 mV at 100 kHz 290 μV/V at 2 mV at 200 kHz 320 μV/V at 2 mV at 300 kHz 520 μV/V at 2 mV at 500 kHz 140 μV/V from 10 mV to 30 mV at 10 Hz 100 μV/V from 10 mV to 30 mV at 20 Hz 80 μV/V from 10 mV to 30 mV from 40 Hz to 50 kHz 90 μV/V from 10 mV to 30 mV at 100 kHz 130 μV/V from 10 mV to 30 mV at 200 kHz 165 μV/V from 10 mV to 30 mV at 300 kHz 350 μV/V from 10 mV to 30 mV at 500 kHz 1200 μV/V from 10 mV to 30 mV at 1 MHz 55 μV/V above 30 mV to 300 mV at 10 Hz 45 μV/V above 30 mV to 300 mV at 20 Hz 55 μV/V above 30 mV to 300 mV from 40 Hz to 100 kHz 95 μV/V above 30 mV to 300 mV at 200 kHz 150 μV/V above 30 mV to 300 mV at 300 kHz 350 μV/V above 30 mV to 300 mV at 500kHz 1330 μV/V above 30 mV to 300 mV at 1 MHz 55 μV/V above 300 mV to 200 V at 10 Hz 50 μV/V above 300 mV to 300 V from 20 Hz to 50 kHz 45 μV/V above 300 mV to 700m V from 100 kHz to 300 kHz 65 μV/V above 300 mV to 700 mV at 500 kHz 100 μV/V above 300 mV to 700 mV at 1 MHz 60 μV/V above 700 mV to 2.2 V at 100 kHz 290 μV/V above 700 mV to 2.2 V at 200 kHz 350 μV/V above 700 mV to 2.2 V at 300 kHz 1800 μV/V above 700 mV to 2.2 V at 500 kHz 5300 μV/V above 700 mV to 2.2 V at 1 MHz 50 μV/V above 2.2 V to 7 V at 100 kHz 70 μV/V above 2.2 V to 7 V at 200 kHz 75 μV/V above 2.2 V to 7 V at 300 kHz 700 μV/V above 2.2 V to 7 V and from 500 kHz to 1 MHz 50 μV/V above 7 V to 300 V at 100 kHz 65 μV/V above 7 V to 100 V at 200 kHz 70 μV/V above 7 V to 60 V and from 300 kHz to 500 kHz 75 μV/V above 7 V to 22 V at 1 MHz 50 μV/V above 300 V to 1000 V at 40 Hz to 50 kHz 75 μV/V above 300 V to 1000 V at 100 kHz 700 μV/V from 0.2 V to 3 V from 1 MHz to less than 10 MHz 1000 μV/V from 0.2 V to 3 V from 10 MHz to less than 30 MHz 1900 μV/V from 0.2 V to 3 V at 30 MHz
DC and low frequency electrical metrology - Electrical measurement and test equipment	Ammeters; Appliance testers; Current clamps; Data recorders; Digital multimeters (DMM); Galvanometers and null detectors; Insulation resistance test equipment; Ohm meters; Phase angle meters; Power analysers; Power supplies; Residual current circuit breaker testers; Residual current devices (RCD) testers; Watt meters	AC current	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 165 μA/A from 100 μA to 200 μA from 10 Hz to <1 kHz 380 μA/A from 100 μA to 200 μA at 1 kHz 750 μA/A from 100 μA to 200 μA at 5 kHz 1000 μA/A from 100 μA to 200 μA at 10 kHz 185 μA/A above 200 μA to 2 mA from 10 Hz to <1 kHz 165 μA/A above 200 μA to 2 mA at 1 kHz 425 μA/A above 200 μA to 2 mA at 5 kHz 750 μA/A above 200 μA to 2 mA at 10 kHz 90 μA/A above 2 mA to 20 A from 10 Hz to <1 kHz 120 μA/A above 2 mA to 20 A at 1 kHz 450 μA/A above 2 mA to 20 A at 5 kHz 940 μA/A above 2 mA to 20 A at 10 kHz 2600 μA/A from 10 mA to 300 mA at 30 kHz
	Ammeters; Digital multimeters (DMM); Power supplies; Watt meters	DC current	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 4% + 0.1 fA up to 20 pA 1.5% above 20 pA to 200 pA 5000 μA/A above 200 pA to 20 nA 2000 μA/A above 20 nA to 10 μA 14 μA/A above 10 μA to 1 A 23 μA/A above 1 A to 10 A 45 μA/A above 10 A to 100 A 200 μA/A above 100 A to 200 A
	Appliance testers; Capacitance meters; Data recorders; Digital multimeters (DMM); Galvanometers and null detectors; Insulation resistance test equipment; LCR meters; Ohm meters; Phase angle meters; Power analysers; Power supplies; Voltmeters; Watt meters	AC voltage	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 310 μV/V at 2 mV from 20 Hz to 50 kHz 300 μV/V at 2 mV at 100 kHz 450 μV/V at 2 mV from 200 kHz to 500 kHz 165 μV/V from 10 mV to 30 mV at 10 Hz 140 μV/V from 10 mV to 30 mV at 20 Hz 125 μV/V from 10 mV to 30 mV from 40 Hz to 50 kHz 130 μV/V from 10 mV to 30 mV from 100 kHz to 300 kHz 140 μV/V from 10 mV to 30 mV at 300 kHz 160 μV/V from 10 mV to 30 mV at 500 kHz 200 μV/V from 10 mV to 30 mV at 1 MHz 75 μV/V above 30 mV to 300 mV at 10 Hz 70 μV/V above 30 mV to 300 mV from 20 Hz to 100 kHz 75 μV/V above 30 mV to 300 mV at 200 kHz 85 μV/V above 30 mV to 300 mV at 300 kHz 100 μV/V above 30 mV to 300 mV at 500 kHz 205 μV/V above 30 mV to 300 mV at 1 MHz 55 μV/V above 300 mV to 200 V at 10 Hz 50 μV/V from 30 mV to 300 V from 20 Hz to 50 kHz 50 μV/V from 30 mV to 700 mV from 100 kHz to 500 kHz 110 μV/V from 30 mV to 700 mV at 1 MHz 45 μV/V above 700 mV to 2.2 V from 100 kHz to 200 kHz 50 μV/V above 700 mV to 2.2 V at 300 kHz 100 μV/V above 700 mV to 2.2 V at 500 kHz 110 μV/V above 700 mV to 2.2 V at 1 MHz 50 μV/V above 2.2 V to 7 V from 100 kHz to 300 kHz 100 μV/V above 2.2 V to 7 V at 500 kHz 110 μV/V above 2.2 V to 7 V at 1 MHz 50 μV/V above 7 V to 300 V at 100 kHz 50 μV/V above 7 V to 100 V at 200 kHz 70 μV/V above 7 V to 60 V at 300 kHz 120 μV/V above 7 V to 30 V at 500 kHz 120 μV/V above 7 V to 22 V at 1 MHz 50 μV/V above 300 V to 1000 V from 40 Hz to 50 kHz 75 μV/V above 300 V to 1000 V at 100 kHz
	Current clamps	AC current; DC current	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 0.2% from 1 mA to 1000 A, (DC and from 50 Hz to 1 kHz) 0.64% from 1000 A to 5000 A, (DC and from 50 Hz to 400 Hz)
	Data recorders; Digital multimeters (DMM); Insulation resistance test equipment; Power analysers; Power supplies; Residual current circuit breaker testers; Voltmeters; Watt meters	DC voltage	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 2.4 μV/V at 1.018 V and 10 V 3.7 μV/V + 0.1 μ V from 1 mV to 100 V 6.4 μV/V above 100 to 1100 V
	Data recorders; Digital multimeters (DMM); Ohm meters	Resistance	Comparison with a reference standard		Including megohmmeters up to 1 TΩ and up to 5 000 V dc applied voltage
Capability with Calibration and Measurement Capability of - 100 μΩ/Ω from 10 μΩ to 1 mΩ 10 μΩ/Ω from 1 to 100 mΩ 3 μΩ/Ω from 100 mΩ to 1 Ω 1 μΩ/Ω from 1 Ω to 10 kΩ 2 μΩ/Ω from 10 to 100 kΩ 3 μΩ/Ω from 100 kΩ to 1 MΩ 50 μΩ/Ω from 1 to 100 MΩ 0.2% from 100 MΩ to 10 GΩ 0.3% from 10 GΩ to 1 TΩ
	Data recorders; Power analysers; Power supplies; Watt meters	Apparent power	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 0.1% from 0.1 V up to 1000 V and from 0.001 A to 20 A on DC (50 Hz at unity power factor)
	Galvanometers and null detectors	AC voltage; DC voltage	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 0.1% + 0.1 μV from 0 V to 1 mV
	LCR meters	Capacitance	Comparison with a reference standard
Capability from 50 Hz to 1 kHz with Calibration and Measurement Capability of - 0.03% + 0.1 pF from 1 pF to 1 μF 0.045% from 1 μF to 110 μF
		Resistance	Comparison with a reference standard
Capability D.C. Resistance with Calibration and Measurement Capability of - 0.035% at 1 Ω 0.02% from 1 Ω to 1 MΩ 0.035% from 1 MΩ to 2 MΩ
		Inductance	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - Inductance at 1 kHz 0.05% from 100 μH to 100 mH 0.13% at 10 H
DC and low frequency electrical metrology - Electrical standards	AC/DC transfer instruments	Current	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 50 μA/A from 100 μA to 20 A at 57 Hz 85 μA/A from 100 μA to 20 A and 100 Hz to 1 kHz 750 μA/A from 100 μA to 20 A and above 1 kHz to 10 kHz 300 μA/A from 10 mA to 300 mA at 30 kHz
		Voltage	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 715 μV/V at 2 mV from 20 Hz to 30 Hz 510 μV/V at 2 mV from 40 Hz to 50 kHz 1100 μV/V at 2 mV and at 100 kHz 1250 μV/V at 2 mV and at 200 kHz 1550 μV/V at 2 mV and at 300 kHz 1550 μV/V at 2 mV and at 500 kHz 2100 μV/V at 2 mV and at 1 MHz 210 μV/V from 2 mV to 10 mV and 40 Hz to 50 kHz 510 μV/V from 2 mV to 10 mV at 100 kHz 620 μV/V from 2 mV to 10 mV at 200 kHz 820 μV/V from 2 mV to 100 mV and 300 kHz to 500 kHz 1000 μV/V from 2 mV to 600 mV at 1 MHz 820 μV/V at 10 mV and at 10 Hz 310 μV/V above 10 mV to 600 mV at 10 Hz 620 μV/V from 10 mV to 300 mV and 20 Hz to 30 Hz 100 μV/V above 300 mV to 600 mV and 20 Hz to 30 Hz 85 μV/V from 10 mV to 100 mV and 40 Hz to 50 kHz 50 μV/V above 100 mV to 600 mV and 40 Hz to 50 kHz 410 μV/V from 10 mV to 100 mV and 100 kHz to 200 kHz 205 μV/V above 100 mV to 600 mV and 100 kHz to 200 kHz 205 μV/V from 100 mV to 600 mV and 300 kHz to 500 kHz 310 μV/V from 0.6 V to 1000 V and at 10 Hz 100 μV/V from 0.6 V to 1000 V from 20 Hz to 40 Hz 20 μV/V from 0.6 V to 400 V and 50 Hz to 10 kHz 20 μV/V from 0.6 V to 60 V and at 20 kHz 30 μV/V from 0.6 V to 400 V and at 50 kHz 45 μV/V from 0.6 V to 60 V and at 100 kHz 175 μV/V from 0.6 V to 60 V and 200 kHz to 500 kHz 205 μV/V from 0.6 V to 20 V and 500 kHz to 1 MHz 25 μV/V above 60 V to 400 V and at 20 kHz 55 μV/V from 60 V to 400 V and at 100 kHz 30 μV/V from 400 V to 1000 V and at 50 Hz 40 μV/V from 400 V to 1000 V and 400 Hz to 20 kHz 85 μV/V from 400 V to 1000 V and at 50 kHz 125 μV/V from 400 V to 1000 V and at 100 kHz 600 μV/V from 0.2 V to 3 V and at 3 MHz 900 μV/V from 0.2 V to 3 V and at 10 MHz 1500 μV/V from 0.2 V to 3 V and at 30 MHz 3000 μV/V from 0.2 V to 3 V and at 50 MHz 9000 μV/V from 0.2 V to 3 V and at 100 MHz 3000 μV/V at 0.27 V and at 70 MHz
	Conductance boxes; Precision resistors; Resistance boxes	Resistance	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 100 μΩ/Ω from 10 μΩ to 1 mΩ 10 μΩ/Ω above 1 to 100 mΩ 3 μΩ/Ω above 100 mΩ to 1 Ω 1 μΩ/Ω above 1 Ω to 10 kΩ 2 μΩ/Ω above 10 to 100 kΩ 3 μΩ/Ω above 100 kΩ to 1 MΩ 50 μΩ/Ω above 1 to 100 MΩ 0.2% above 100 MΩ to 10 GΩ 0.3% above 10 GΩ to 1 TΩ
	Current shunts	Current	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - DC shunts with Calibration and Measurement Capability of - 5 μΩ/Ω from 10 μA to 100 mA 9 μΩ/Ω above 100 mA to 1 A 20 μΩ/Ω above 1 A to 10 A 30 μΩ/Ω above 10 A to 100 A AC shunts from 100 μA to 20 A with Calibration and Measurement Capability of - 60 μΩ/Ω from 40 Hz to 57 Hz 110 μΩ/Ω at 1 kHz 720 μΩ/Ω at 5 kHz and 10 kHz
	Inductors	Inductance	Comparison with a reference standard
Capability Two terminal inductors at 1 kHz with Calibration and Measurement Capability of - 0.1% from 0.1 mH to 1 mH 0.05% above 1 mH to 100 mH 0.13% at 10 H
	Potential dividers; Voltage ratio boxes	Voltage ratio	Comparison with a reference standard
Capability Volt ratio boxes with fixed ratios with Calibration and Measurement Capability of - 2 μV/V of input from 0.1 V to 500 V 4 μV/V of input above 500 V to 1100 V Variable ratio potential dividers from 10^-7 to 1.1 with Calibration and Measurement Capability of - 2 μV/V of input from 0.1 V to 500 V 4 μV/V of input above 500 V to 1100 V
	Precision capacitors	Capacitance	Comparison with a reference standard
Capability Three terminal capacitors from 40 Hz up to 1 kHz with Calibration and Measurement Capability of - 30 μF/F + 0.1 fF from 0.1 pF up to 1000 pF 0.01% from 1000 pF to 1.1 μF Two terminal capacitors from 50 Hz to 1 kHz with Calibration and Measurement Capability of - (0.1% + 0.02 pF) from 1 pF to 110 μF
	Voltage standards - E.M.F. reference devices	Voltage; Voltage AC-DC difference; Voltage ratio	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 1.5 μV/V at 1.0, 1.018 and 10 V
	Voltage standards - Standard cells	Voltage; Voltage AC-DC difference; Voltage ratio	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 1.5 μV at 1.018 V and 1.019 V
DC and low frequency electrical metrology - High-voltage/high-current standards and equipment	High voltage measurement systems	Voltage	Comparison with a reference standard
Capability with Calibration and Measurement Capability of - 2500 μV/V from 1.1 kV to 10 kV
High frequency electrical metrology - Communications, electromagnetic field strength and EMC test equipment	Amplifiers; Artificial mains networks (AMN); Attenuators; Coupling/decoupling networks (CDN); Data transmission measuring equipment; Electrical fast transients (EFT) and surge generators; Electrical noise and interference measuring equipment; Flicker harmonics load unit; Harmonic emission compliance test systems; Impedance and reflection measuring equipment; Line impedance stabilisation networks (LISN); Line transmission measuring equipment; Power measuring equipment; Radio transmission measuring equipment; Short interruptions and voltage variations; Spectrum analysers; Voltage dips; Voltage fluctuation and flicker compliance test systems; Waveguide and coaxial components	Reflection coefficient	Comparison with a reference standard; Direct measurement by electrical input
Capability Determination of magnitude of reflection coefficient with Calibration and Measurement Capability of - For One Port Measurements: 0.005 from 0.001 to 0.1 and from 40 kHz to 18 GHz (type N connector) 0.01 from above 0.1 to 1 and from 40 kHz to 18 GHz (type N connector) 0.014 from 0.001 to 0.1 and from 70 kHz to 40 GHz (for 2.92 mm connectors) 0.03 from above 0.1 to 1 and from 70 kHz to 40 GHz (for 2.92 mm connectors) For Two Port Measurements: 0.006 from 0.001 to 0.1 and from 40 kHz to 18 GHz (type N connector) 0.012 from above 0.1 to 1 and from 40 kHz to 18 GHz (type N connector) 0.015 from 0.001 to 0.1 and from 70 kHz to 40 GHz (for 2.92 mm connectors) 0.032 from above 0.1 to 1 and from 70 kHz to 40 GHz (for 2.92 mm connectors) Determination of phase of reflection coefficient with Calibration and Measurement Capability of - sin^-1[linear uncertainty/linear]° (phase uncertainty is ±180° when linear uncertainty > linear)
	Amplifiers; Artificial mains networks (AMN); Coupling/decoupling networks (CDN); Data transmission measuring equipment; Electrical fast transients (EFT) and surge generators; Electrical noise and interference measuring equipment; Flicker harmonics load unit; Harmonic emission compliance test systems; Impedance and reflection measuring equipment; Line impedance stabilisation networks (LISN); Line transmission measuring equipment; Power measuring equipment; Radio transmission measuring equipment; Spectrum analysers; Voltage dips; Voltage fluctuation and flicker compliance test systems; Waveguide and coaxial components	Attenuation	Comparison with a reference standard; Direct measurement by electrical input
Capability with Calibration and Measurement Capability of - 0.003 dB + 0.0005 dB/ 10 dB from 0 to 60 dB at D.C and 10 Hz to 10 kHz 0.04 dB + 0.005 dB/ 10 dB above 60 dB to 110 dB at D.C. and 10 Hz to 10 kHz 0.007 dB + 0.001 dB/ 10 dB from 0 to 70 dB at 10 kHz to 30 MHz 0.014 dB + 0.02 dB/ 10 dB above 70 dB to 120 dB at 10 kHz to 30 MHz 0.02 dB + 0.02 dB/ 10 dB from 0 to 110 dB at 30 MHz to 18 GHz 0.24 dB + 0.3 dB/ 10 dB above 110 dB to 120 dB at 30 MHz to 18 GHz 0.04 dB + 0.04 dB per 10 dB step from 0 dB to 100 dB from 100 kHz to 40 GHz (2.92 mm connector)
	Power measuring equipment; Spectrum analysers	Power	Comparison with a reference standard; Direct measurement by electrical input
Capability Determination of calibration factor and/or output power measurement with Calibration and Measurement Capability of - 0.65% from 1 μW to 100 mW from D.C. to 30 MHz; 0.6% from 1 μW to 2 W from 30 to 500 MHz; 0.6% + 0.07% per GHz from 1 μW to 2 W from 500 MHz to 18 GHz (50 Ω coaxial); 1.5% + 0.07% per GHz from 1 μW to 2 W from 8.2 GHz to 18 GHz ("X" and "P" band waveguides); 10% from 2 W to 50 W from 30 MHz to 250 MHz 4.5% from 2 W to 15 W from 800 MHz to 2.5 GHz Determination of calibration factor (power measuring instruments) with Calibration and Measurement Capability of - 0.65% from 100 µW to 2 mW and from 10 MHz to 300 MHz (for 2.92 mm connectors) 0.75% from 1 µW to below 100 µW and from 10 MHz to 300 MHz (for 2.92 mm connectors) 1.0% + 0.05%/GHz from 1 µW to 2 mW and from above 300 MHz to below 18 GHz (for 2.92 mm connectors) 1.9% from 1 µW to 2 mW and from 18 GHz to below 36 GHz (for 2.92 mm connectors) 2.2% from 1 µW to 2 mW and from 36 GHz to 40 GHz (for 2.92 mm connectors) Determination of output power measurement of tuned low source reflection (Precision Signal Sources) with Calibration and Measurement Capability of - From 1 µW to below 10 µW 0.85% from 10 MHz to 300 MHz (for 2.92 mm connectors) 1.2% + 0.05%/GHz from above 300 MHz to below 18 GHz (for 2.92 mm connectors) 2.1% from 18 GHz to below 36 GHz (for 2.92 mm connectors) 2.3% from 36 GHz to 40 GHz (for 2.92 mm connectors) From 10 µW to below 100 µW 0.85% from 10 MHz to 300 MHz (for 2.92 mm connectors) 1.1% + 0.05%/GHz from above 300 MHz to below 18 GHz (for 2.92 mm connectors) 2.0% from 18 GHz to below 36 GHz (for 2.92 mm connectors) 2.2% from 36 GHz to 40 GHz (for 2.92 mm connectors) From 100 µW to 2 mW 0.65% from 10 MHz to 300 MHz (for 2.92 mm connectors) 1.0% + 0.05%/GHz from above 300 MHz to below 18 GHz (for 2.92 mm connectors) 1.9% from 18 GHz to below 36 GHz (for 2.92 mm connectors) 2.2% from 36 GHz to 40 GHz (for 2.92 mm connectors)
	Waveguide and coaxial components	Insertion loss	Comparison with a reference standard; Direct measurement by electrical input
Capability with Calibration and Measurement Capability of - 0.005 dB at 8.2 GHz to 18 GHz ("X" and "P" band waveguides) coupling factor, directivity and insertion loss of directional couplers
Pressure metrology - Pressure and vacuum measuring equipment	Barometers; Digital pressure gauges; Mechanical pressure gauges; Pressure recorders; Pressure transducers; Vacuum gauges	Absolute pressure; Gauge pressure	By pressure calibrator; Comparison with dead weight tester; Comparison with reference instrument	MSA Test Method 1; MSA Test Method 2
Capability Pneumatic devices with Calibration and Measurement Capability of - 0.01% of reading or 16 Pa (whichever is greater) from -100 kPa to 800 kPa 0.015% above 800 kPa to 83.5 MPa Hydraulic devices with Calibration and Measurement Capability of - 0.07 kPa from 45 kPa to 300 kPa; 0.01% above 300 kPa to 83.5 MPa Absolute pressure with Calibration and Measurement Capability of - 0.01% of reading or 16 Pa (whichever is greater) from 1 kPa to 700 kPa 0.015% of reading above 700 kPa to 10 MPa
Pressure metrology - Pressure standards	Pressure calibrators - Non-dead weight	Absolute pressure; Gauge pressure	Comparison with dead weight tester; Comparison with reference instrument	MSA Test Method 1
Capability Pneumatic devices with Calibration and Measurement Capability of - 0.01% of reading or 16 Pa (whichever is greater) from -100 kPa to 800 kPa 0.015% above 800 kPa to 83.5 MPa Hydraulic devices with Calibration and Measurement Capability of - 0.07 kPa from 45 kPa to 300 kPa; 0.01% above 300 kPa to 83.5 MPa Absolute pressure with Calibration and Measurement Capability of - 0.01% of reading or 16 Pa (whichever is greater) from 1 kPa to 700 kPa 0.015% of reading above 700 kPa to 10 MPa
Temperature metrology - Ancillary temperature measuring equipment	Multi-channel thermocouple data recorders; Process calibrators	Resistance to temperature conversion; Volt to temperature conversion	Direct measurement by electrical input
Capability with Calibration and Measurement Capability of - RTD devices (measure mode): 0.1 ºC above -50 ºC to 200 ºC 0.2 ºC above 200 ºC to 650 ºC RTD devices (source mode): 0.02 ºC above -50 ºC to 650 ºC Thermocouple devices (measure and source mode): Type E, J, K, N and T thermocouples: 0.20 ºC from -250 ºC to below 0 ºC 0.15 ºC from 0 ºC to 1370 ºC Type R Thermocouple: 0.30 ºC from 0 ºC to 1750 ºC
Temperature metrology - Temperature measuring equipment	Base metal thermocouples	Temperature	Measurement against reference standard
Capability with Calibration and Measurement Capability of - 0.05 ºC at 25 ºC 0.3 ºC + 0.1%T from -40 ºC to 300 ºC 0.6 ºC + 0.1%T above 300 ºC to 500 ºC 1 ºC above 500 ºC to 650 ºC
	Digital temperature measuring systems	Temperature	Measurement against reference standard
Capability with Calibration and Measurement Capability of - 0.025 ºC at 0 ºC 0.05 ºC from -40 ºC to 100 ºC 0.3 ºC + 0.1%T above 100 ºC to 300 ºC 0.6 ºC + 0.1%T above 300 ºC to 500 ºC 1 ºC above 500 ºC to 650 ºC
Temperature metrology - Temperature standards and reference equipment	Dry block calibrators	Temperature	Direct measurement using a reference standard
Capability with Calibration and Measurement Capability of - 0.05 ºC at 0 ºC 0.15 ºC + 0.05%T from -50 ºC to 300 ºC 0.35 ºC + 0.05%T above 300 ºC to 650 ºC
Time and frequency metrology - Frequency and time standards	Frequency standards	Frequency	Measurement against reference standard
Capability with Calibration and Measurement Capability of - 1.2 in 10¹⁰ at 0.1 MHz 1.2 in 10¹¹ at 1 MHz 1 in 10¹¹ at 5 MHz 1 in 10¹¹ at 10 MHz
	Signal sources	Voltage	Measurement against reference standard
Capability with Calibration and Measurement Capability of - 275 μV/V at 2 mV at 20 Hz 250 μV/V at 2 mV from 40 Hz to 50 kHz 260 μV/V at 2 mV at 100 kHz 290 μV/V at 2 mV at 200 kHz 320 μV/V at 2 mV at 300 kHz 520 μV/V at 2 mV at 500 kHz 140 μV/V from 10 mV to 30 mV at 10 Hz 100 μV/V from 10 mV to 30 mV at 20 Hz 80 μV/V from 10 mV to 30 mV from 40 Hz to 50 kHz 90 μV/V from 10 mV to 30 mV at 100 kHz 130 μV/V from 10 mV to 30 mV at 200 kHz 165 μV/V from 10 mV to 30 mV at 300 kHz 350 μV/V from 10 mV to 30 mV at 500 kHz 1200 μV/V from 10 mV to 30 mV at 1 MHz 55 μV/V above 30 mV to 300 mV at 10 Hz 45 μV/V above 30 mV to 300 mV at 20 Hz 55 μV/V above 30 mV to 300 mV from 40 Hz to 100 kHz 95 μV/V above 30 mV to 300 mV at 200 kHz 150 μV/V above 30 mV to 300 mV at 300 kHz 350 μV/V above 30 mV to 300 mV at 500 kHz 1330 μV/V above 30 mV to 300 mV at 1 MHz 55 μV/V above 300 mV to 200 V at 10 Hz 50 μV/V above 30 mV to 300 V from 20 Hz to 50 kHz 45 μV/V above 30 mV to 700 mV from 100 kHz to 300 kHz 65 μV/V above 30 mV to 700 mV at 500 kHz 100 μV/V above 30 mV to 700 mV at 1 MHz 60 μV/V above 700 mV to 2.2 V at 100 kHz 290 μV/V above 700 mV to 2.2 V at 200 kHz 350 μV/V above 700 mV to 2.2 V at 300 kHz 1800 μV/V above 700 mV to 2.2 V at 500 kHz 5300 μV/V above 700 mV to 2.2 V at 1 MHz 50 μV/V above 2.2 V to 7 V at 100 kHz 70 μV/V above 2.2 V to 7 V at 200 kHz 75 μV/V above 2.2 V to 7 V at 300 kHz 700 μV/V above 2.2 V to 7 V from 500 kHz to 1 MHz 50 μV/V above 7 V to 300 V at 100 kHz 65 μV/V above 7 V to 100 V at 200 kHz 70 μV/V above 7 V to 60 V from 300 kHz to 500 kHz 75 μV/V above 7 V to 22 V at 1 MHz 50 μV/V from 300 V to 1000 V at 40 Hz to 50 kHz 75 μV/V from 300 V to 1000 V at 100 kHz 700 μV/V from 0.2 V to 3 V from 1 MHz to less than 10 MHz 1000 μV/V from 0.2 V to 3 V from 10 MHz to less than 30 MHz 1900 μV/V from 0.2 V to 3 V at 30 MHz
		Frequency	Measurement against reference standard
Capability with Calibration and Measurement Capability of - 1 in 10⁶ from 10 mHz to 1 Hz 1 in 10⁸ above 1 Hz to 100 Hz 5 in 10⁹ above 100 Hz to 10 kHz 5 in 10¹¹ above 10 kHz to 10 MHz 5 in 10¹⁰ above 10 MHz to 18 GHz 5 in 10¹⁰ above 18 GHz to 40 GHz
		Modulation	Measurement against reference standard
Capability Amplitude and frequency modulation with Calibration and Measurement Capability of - 1% from 1 MHz to 18 GHz
Time and frequency metrology - Frequency, time and waveform measuring equipment	Clocks and timers	Time interval	Measurement against reference standard
Capability Stopwatches with Calibration and Measurement Capability of - 0.040 s from 1 s to 30 min 0.30 s from 30 min to 3 h Stop clock with Calibration and Measurement Capability of - 0.025 s from 0.5 s to 1 h
	Counters; Frequency analysers; Oscilloscopes; Stroboscopes; Waveform measuring instruments	Frequency	Measurement against reference standard
Capability with Calibration and Measurement Capability of - 1 in 10⁶ from 10 mHz to 1 Hz 1 in 10⁸ above 1 Hz to 100 Hz 5 in 10⁹ above 100 Hz to 10 kHz 5 in 10¹¹ above 10 kHz to 10 MHz 5 in 10¹⁰ above 10 MHz to 18 GHz 5 in 10¹⁰ above 18 GHz to 40 GHz
	Frequency analysers; Oscilloscopes; Time interval meters; Waveform measuring instruments	Time interval	Measurement against reference standard
Capability with Calibration and Measurement Capability of - 5 in 10¹¹ + 5 ns from 10 ns to 20 000 s
	Frequency analysers; Oscilloscopes; Waveform measuring instruments	Rise/fall time	Measurement against reference standard
Capability with Calibration and Measurement Capability of - 9 ps from a minimum of 25 ps
		Distortion	Measurement against reference standard
Capability with an input voltage range 50 mV to 300 V and 10 Hz to 1 MHz with Calibration and Measurement Capability of - 0.1 dB from -10 dB to -60 dB 0.3 dB from -60 dB to -80 dB
	Frequency meters	Frequency	Measurement against reference standard
Capability with Calibration and Measurement Capability of - 1 in 10⁷ from 0.1 MHz to 18 GHz
	Tachometers	Rotational speed	Comparison with a reference standard
Capability Optical tachometers with Calibration and Measurement Capability of - 17 μHz from 0.017 Hz to 1.67 Hz (0.001 rpm from 1 rpm to 100 rpm) 10 μHz/Hz from 1.67 Hz to 16666.7 Hz (0.001% from 100 rpm to 1000000 rpm)

ISO/IEC 17025 (2017)

Manufactured Goods

Service	Product	Determinant	Technique	Procedure	Limitations
Evaluation of electrical appliances and devices - Performance	External power supplies, stabilisers and related items	Drift; Electrical parameters; Frequency and time interval; Input impedance; Insulation resistance; Line regulation; Load regulation; Meter accuracy; Power; Power factor; Recovery time - Transient response; Ripple - Noise	Not applicable	Performance tests on power supplies by the methods of Calibration Procedure CP910125 or Manufacturers Performance Verification	A.C/D.C power, A.C/D.C voltage A.C/D.C current

Service

Product

Determinant

Technique

Procedure

Limitations

Evaluation of electrical appliances and devices - Performance

External power supplies, stabilisers and related items

Drift; Electrical parameters; Frequency and time interval; Input impedance; Insulation resistance; Line regulation; Load regulation; Meter accuracy; Power; Power factor; Recovery time - Transient response; Ripple - Noise

Not applicable

Performance tests on power supplies by the methods of Calibration Procedure CP910125 or Manufacturers Performance Verification

A.C/D.C power,

A.C/D.C voltage

A.C/D.C current

The only data displayed is that deemed relevant and necessary for the clear description of the activities and services covered by the scope of accreditation.

Grey text appearing in a SoA is additional freetext providing further refinement or information on the data in the preceding line entry.

TR Calibration Sydney Facility

Scope of Accreditation

ISO/IEC 17025 (2017)

ISO/IEC 17025 (2017)

Benefits of being a NATA accredited organisation